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Voltage on Any Pin ...................-0.5V to +VCC + 0.5V(1)(2)
Notes: 1. All specified voltages are with respect to GND. During transitions, this level may undershoot to -2.0V for periods of <20 ns. During transitions, this level may overshoot to VCC + 2.0V for periods <20 ns. 2. Do not violate processor or chipset limitations on the INIT pin.
*NOTICE: Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability
AT49LH002 Typical Application
AT49LH002
AT49LH002 Connection Diagram
AT49LH002-33TC Parameters
Technical/Catalog Information
AT49LH002-33TC
Vendor
Atmel
Category
Integrated Circuits (ICs)
Memory Type
FLASH
Memory Size
2M (256K x 8)
Speed
33MHz
Interface
Parallel
Package / Case
40-TSOP
Packaging
Tray
Voltage - Supply
3 V ~ 3.6 V
Operating Temperature
0°C ~ 85°C
Format - Memory
FLASH
Drawing Number
*
Lead Free Status
Contains Lead
RoHS Status
RoHS Non-Compliant
Other Names
AT49LH002 33TC AT49LH00233TC
AT49LH004 Parameters
AT49LH004 Datasheet and Application Notes
AT49LH004
AT49LH004 General Description
4-Megabit Firmware Hub and low-pin count flash memory.
AT49LH004 Maximum Ratings
Voltage on Any Pin ...................-0.5V to +VCC + 0.5V(1)(2)
Notes: 1. All specified voltages are with respect to GND. During transitions, this level may undershoot to -2.0V for periods of <20 ns.During transitions, this level may overshoot to VCC + 2.0V for periods <20 ns. 2. Do not violate processor or chipset limitations on the INIT pin.
*NOTICE: Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability