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These P-Channel logic level MOSFETs are produced using Fairchild Semiconductor's advanced PowerTrench process that has been especially tailored to minimize on-state resistance and yet maintain low gate charge for superior switching performance.
These devices have been designed to offer exceptional power dissipation in a very small footprint for applications where the bigger more expensive SO-8 and TSSOP-8 packages are impractical.
FDC6506P Maximum Ratings
Symbol
Parameter
Ratings
Units
VDSS
Drain-Source Voltage
-30
V
VGSS
Gate-Source Voltage
± 20
V
ID
Drain Current - Continuous (Note 1a)
- Pulsed
-1.8
A
-10
PD
Power Dissipation for Single Operation (Note 1a)
(Note 1b) (Note 1c)
0.96
W
0.9
0.7
TJ, Tstg
Operating and Storage Junction Temperature Range
-55 to +150
°C
FDC6506P Features
• -1.8 A, -30 V. RDS(on)= 0.170 Ω @ VGS = -10 V RDS(on)= 0.280 Ω @ VGS = -4.5V • Low gate charge (2.3nC typical). • Fast switching speed. • High performance trench technology for extremely low RDS(on) • SuperSOTTM-6 package: small footprint (72% smaller than standard SO-8); low profile (1mm thick).
FDC6506P Typical Application
• Load switch • Battery protection • Power management
This N-Channel enhancement mode power field effect transistors is produced using Fairchild's proprietary, high cell density, DMOS technology. This very high density process is tailored to minimize on-state resistance. These devices are particularly suited for low voltage applications in notebook computers, portable phones, PCMICA cards, and other battery powered circuits where fast switching, and low in-line power loss are needed in a very small outline surface mount package.
·5 A, 30 V. RDS(ON) = 0.035 W @ VGS = 10 V RDS(ON) = 0.055 W @ VGS = 4.5 V. ·Proprietary SuperSOTTM-6 package design using copper lead frame for superior thermal and electrical capabilities. ·High density cell design for extremely low RDS(ON). ·Exceptional on-resistance and maximum DC current capability.