IS23SC1604, IS23SC4428, IS23SC4442 Selling Leads, Datasheet
MFG:ISSI,ISSI, Package Cooled:, D/C:08.09+
IS23SC1604, IS23SC4428, IS23SC4442 Datasheet download

Part Number: IS23SC1604
MFG: ISSI,ISSI,
Package Cooled: ,
D/C: 08.09+
MFG:ISSI,ISSI, Package Cooled:, D/C:08.09+
IS23SC1604, IS23SC4428, IS23SC4442 Datasheet download

MFG: ISSI,ISSI,
Package Cooled: ,
D/C: 08.09+
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PDF/DataSheet Download
Datasheet: IS201
File Size: 77951 KB
Manufacturer: ETC [ETC]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: IS23SC4428
File Size: 51690 KB
Manufacturer: ISSI
Download : Click here to Download
PDF/DataSheet Download
Datasheet: IS23SC4442
File Size: 51690 KB
Manufacturer: ISSI
Download : Click here to Download
IS23SC1604 is a low-cost, low-power, highly secured 16K bits (2K x 8) serial EEPROM. It is fabricated using ISSI's advanced CMOS technology. The security features of IS23SC1604 provide high levels of memory security protection for smart card applications.
The memory is partitioned into four application zones. Each individual application zone is protected by multiple security codes from unauthorized read/write/erase access to the zone.
In addition, an internal security fuse is available for the card issuer to fully personalize the device before releasing it to customer. The device also features an internal high-voltage charge pump for memory programming, 1,000,000 write/erase cycles and ten years of data retention.
| Symbol | Parameter | Min. | Max. | Unit |
| Vcc | Supply Voltage | 0.3 | 6 | V |
| VI / VO | Input/Output Voltage | 0.3 | 6 | V |
| TSTG | Storage Temperature | 40 | 125 | |
| PMAX | Power Dissipation | - | 60 | mV |
Note:
1. Stress greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device.
This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.

