MFG:SAMSUNG Package Cooled:TQFP D/C:04+
K7M321835C-QC75, K7M321835C-QI75, K7M323625M Datasheet download
MFG: SAMSUNG
Package Cooled: TQFP
D/C: 04+
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PDF/DataSheet Download
Datasheet: K7M161825A-QC(I)65
File Size: 286017 KB
Manufacturer: SAMSUNG [Samsung semiconductor]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: K7M161825A-QC(I)65
File Size: 286017 KB
Manufacturer: SAMSUNG [Samsung semiconductor]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: K7M323625M
File Size: 216141 KB
Manufacturer: SAMSUNG [Samsung semiconductor]
Download : Click here to Download
The K7M323625M and K7M321825M are 37,748,736-bits Synchronous Static SRAMs.
The NtRAMTM, or No Turnaround Random Access Memory utilizes all bandwidth in any combination of operating cycles.Address, data inputs, and all control signals except output enable and linear burst order are synchronized to input clock.Burst order control must be tied "High or Low".
Asynchronous inputs include the sleep mode enable(ZZ).Output Enable controls the outputs at any given time.Write cycles are internally self-timed and initiated by the rising edge of the clock input. This feature eliminates complex off-chip write pulse generation and provides increased timing flexibility for incoming signals.For read cycles, Flow-Through SRAM allows output data to simply flow freely from the memory array.
The K7M323625M and K7M321825M are implemented with SAMSUNG¢s high performance CMOS technology and is available in 100pin TQFP packages. Multiple power and ground pins minimize ground bounce.
| PARAMETER | SYMBOL | RATING | UNIT |
| Voltage on VDD Supply Relative to VSS | VDD | -0.5 to 2.9 | V |
| Voltage on VDDQ Supply Relative to VSS | VDDQ | -0.5 to VDD | V |
| Voltage on Input Pin Relative to VSS | VIN | -0.5 to VDD+0.3 | V |
| Storage Temperature | TSTG | -65 to 150 | °C |
| Operating Temperature | TOPR | 0 to 70 | °C |
| Storage Temperature Range Under Bias | TBIAS | -10 to 85 | °C |
*Note: 1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operating sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
2. VDDQ must not exceed VDD during normal operation.
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