74ALVT16823, 74ALVT16899DL, 74ALVT169520DL Selling Leads, Datasheet
MFG:PHI Package Cooled:SSOP D/C:O625
74ALVT16823, 74ALVT16899DL, 74ALVT169520DL Datasheet download

Part Number: 74ALVT16823
MFG: PHI
Package Cooled: SSOP
D/C: O625
MFG:PHI Package Cooled:SSOP D/C:O625
74ALVT16823, 74ALVT16899DL, 74ALVT169520DL Datasheet download

MFG: PHI
Package Cooled: SSOP
D/C: O625
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PDF/DataSheet Download
Datasheet: 74ALVT16823
File Size: 112780 KB
Manufacturer: Philips
Download : Click here to Download
PDF/DataSheet Download
Datasheet: 74ABH16244ADGG
File Size: 77546 KB
Manufacturer: PHILIPS [Philips Semiconductors]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: 74ABH16244ADGG
File Size: 77546 KB
Manufacturer: PHILIPS [Philips Semiconductors]
Download : Click here to Download
The 74ALVT16823 18-bit bus interface register is designed to eliminate the extra packages required to buffer xisting registers and provide extra data width for wider data/address paths of buses carrying parity.
The 74ALVT16823 has two 9-bit wide buffered registers with Clock Enable (nCE) and Master Reset (nMR) which are ideal for parity bus interfacing in high microprogrammed systems.
The registers are fully edge-triggered. The state of each D input, one set-up time before the Low-to-High clock transition is transferred to the corresponding flip-flop's Q output.
It is designed for VCC operation from 2.5 V to 3.0 V with I/O compatibility to 5 V.
| SYMBOL | PARAMETER | CONDITIONS | RATING | UNIT |
| VCC | DC supply voltage | 0.5 to +4.6 | V | |
| IIK | DC input diode current | VI < 0 | 50 | mA |
| VI | DC input voltage3 | 0.5 to +7.0 | V | |
| IOK | DC output diode current | VO < 0 | 50 | mA |
| VOUT | DC output voltage3 | Output in Off or High state | 0.5 to +7.0 | V |
| IOUT | DC output current | Output in Low state | 128 | mA |
| Output in High state | 64 | |||
| Tstg | Storage temperature range | 65 to +150 | mA |
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed.

