HT93C56-A, HT93LC46, HT93LC46A Selling Leads, Datasheet
MFG:HT Package Cooled:SOP8 D/C:08+/09+
HT93C56-A, HT93LC46, HT93LC46A Datasheet download

Part Number: HT93C56-A
MFG: HT
Package Cooled: SOP8
D/C: 08+/09+
MFG:HT Package Cooled:SOP8 D/C:08+/09+
HT93C56-A, HT93LC46, HT93LC46A Datasheet download

MFG: HT
Package Cooled: SOP8
D/C: 08+/09+
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PDF/DataSheet Download
Datasheet: HT9011
File Size: 100623 KB
Manufacturer: HOLTEK [Holtek Semiconductor Inc]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: HT93LC46
File Size: 369521 KB
Manufacturer: HOLTEK [Holtek Semiconductor Inc]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: HT9011
File Size: 100623 KB
Manufacturer: HOLTEK [Holtek Semiconductor Inc]
Download : Click here to Download
The HT93LC46 is a 1K-bit low voltage nonvolatile, serial electrically erasable programmable read only memory device using the CMOS floating gate process. Its 1024 bits of memory are organized into 64 words of 16 bits each when the ORG pin is connected to VCC or organized into 128 words of 8 bits each when it is tied to VSS. The device is optimized for use in many industrial and commercial applications where low power and low voltage operation are essential. By popular microcontroller, the versatile serial interface including chip select (CS), serial clock (SK), data input (DI) and data output (DO) can be easily controlled.
Operation Temperature (Commercial) ...............................................................0°C to 70°C
Applied VCC Voltage with Respect to VSS ..........................................................0.3V to 6.0V
Applied Voltage on any Pin with Respect to VSS.................................... VSS0.3V to VCC+0.3V
Supply READ Voltage................................................................................................2V to 5.5V
Note: These are stress ratings only. Stresses exceeding the range specified under "Absolute Maximum Ratings" may cause substantial damage to the device. Functional operation of this device at other conditions beyond those listed in the specification is not implied and prolonged exposure to extreme conditions may affect device reliability.

