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Offered in 128Mx8bits, the K9T1G08U0M is 1Gbit with spare 32Mbit capacity. The device is offered in 3.3V Vcc. Its NAND cell providesthe most cost-effective solutIon for the solid state mass storage market. A program operation can be performed in typical 200son the 528-bytes and an erase operation can be performed in typical 2ms on a 16K-bytes block. Data in the page can be read out at50ns cycle time per byte. The I/O pins serve as the ports for address and data input/output as well as command input. The on-chipwrite control automates all program and erase functions including pulse repetition, where required, and internal verification and marginingof data. Even the write-intensive systems can take advantage of the K9T1G08U0Ms extended reliability of 100K rogram/ rase cycles by providing ECC(Error Correcting Code) with real time mapping-out algorithm.
The K9T1G08U0M is an optimum solution for large nonvolatile storage applications such as solid state file storage and other portableapplications requiring non-volatility.
K9T1G08U0M Maximum Ratings
Parameter
Symbol
Rating
Unit
-0.6 to +4.6
Voltage on any pin relative to VSS
VIN/OUT
V
VCC/VCCQ
-0.6 to +4.6
Temperature Under Bias
K9T1G08U0M-XCB0
TBIAS
-10 to +125
K9T1G08U0M-XIB0
-40 to +125
Storage Temperature
TSTG
-65 to +150
Short Circuit Current
IOS
5
mA
NOTE : 1. Minimum DC voltage is -0.6V on input/output pins. During transitions, this level may undershoot to -2.0V for periods <30ns.Maximum DC voltage on input/output pins is VCC+0.3V which, during transitions, may overshoot to VCC+2.0V for periods <20ns. 2. Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded. Functional operation should be restricted to the conditions s detailed in the operational sections of this data sheet. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
K9T1G08U0M Features
• Voltage Supply : 2.7V ~ 3.6V • Organization - Memory Cell Array : (128M + 4,096K)bits x 8bits - Data Register : (512 + 16)bits x 8bits • Automatic Program and Erase - Page Program : (512 + 16)bits x 8bits - Block Erase : (16K + 512)Bytes • Page Read Operation - Page Size : (512 + 16)Bytes - Random Access : 15s(Max.) - Serial Page Access : 50ns(Min.) • Fast Write Cycle Time - Program time : 200s(Typ.) - Block Erase Time : 2ms(Typ.) • Command/Address/Data Multiplexed I/O Port • Hardware Data Protection - Program/Erase Lockout During Power Transitions 128M x 8 Bits NAND Flash Memory • Reliable CMOS Floating-Gate Technology - Endurance : 100K Program/Erase Cycles - Data Retention : 10 Years • Command Register Operation • Intelligent Copy-Back • Unique ID for Copyright Protection • Package - K9T1G08U0M-YCB0/YIB0 48 - Pin TSOP I (12 X 20 / 0.5 mm pitch) - K9T1G08U0M-VCB0/VIB0 48 - Pin WSOP I (12 X 17 X 0.7mm) - K9T1G08U0M-PCB0/PIB0 48 - Pin TSOP I (12 X 20 / 0.5 mm pitch)- Pb-free Package - K9T1G08U0M-FCB0/FIB0 48 - Pin WSOP I (12 X 17 X 0.7mm)- Pb-free Package * K9T1G08U0M-V,F(WSOPI ), K9T1G08U0M-Y,P(TSOP1) is he same device as except package type.