M1156, M116, M1161B22 Selling Leads, Datasheet
MFG:MOTOROLA Package Cooled:TO-57
M1156, M116, M1161B22 Datasheet download
Part Number: M1156
MFG: MOTOROLA
Package Cooled: TO-57
D/C:
MFG:MOTOROLA Package Cooled:TO-57
M1156, M116, M1161B22 Datasheet download
MFG: MOTOROLA
Package Cooled: TO-57
D/C:
Want to post a buying lead? If you are not a member yet, please select the specific/related part number first and then fill the quantity and your contact details in the "Request for Quotation Form" on the left, and then click "Send RFQ".Your buying lead can then be posted, and the reliable suppliers will quote via our online message system or other channels soon.
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PDF/DataSheet Download
Datasheet: M1102
File Size: 65695 KB
Manufacturer: PHILIPS [Philips Semiconductors]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: M116
File Size: 20082 KB
Manufacturer: CALOGIC [Calogic, LLC]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: M1102
File Size: 65695 KB
Manufacturer: PHILIPS [Philips Semiconductors]
Download : Click here to Download
Drain to Source Voltage. . . . . . . . . . . . . . . . . . . . . . . . . 30V
Gate to Drain Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . 30V
Drain Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50mA
Gate Zener Current . . . . . . . . . . . . . . . . . . . . . . . . .±0.1mA
Storage Temperature Range . . . . . . . . . . . .-65 to +200
Operating Temperature Range . . . . . . . . . . . -55 to +12
Lead Temperature (Soldering, 10sec) . . . . . . . . . . .. +300
Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . 225mW
Derate above 25 . . . . . . . . . . . . . . . . . . . . . . ...2.2mW/
NOTE: Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions above those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.