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M59DR032EALDZB6, M59DR032-ZB, M59MR032C

M59DR032EALDZB6, M59DR032-ZB, M59MR032C Selling Leads, Datasheet

MFG:ST  Package Cooled:BGA  D/C:1999

M59DR032EALDZB6, M59DR032-ZB, M59MR032C Picture

M59DR032EALDZB6, M59DR032-ZB, M59MR032C Datasheet download

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Part Number: M59DR032EALDZB6

 

MFG: ST

Package Cooled: BGA

D/C: 1999

 

 

 
 
 
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  • M59DR032EALDZB6

  • Vendor: ST D/C: 99+& Qty: 2419  Adddate: 2026-08-16
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  • ASK SEMICONDUCTOR LTD   China
    Contact: Mr.Subaninfo@asksemi.com   MSN:asksemiconductor@hotmail.com
    Tel: 86-0755-33060075/0755-29183325/0755-83221176
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About M59104

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Datasheet: M59104

File Size: 82050 KB

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  • M59253FP

  • Vendor: MITSUBISHI D/C: 02+& Qty: 44  Adddate: 2026-08-16
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  • ASK SEMICONDUCTOR LTD   China
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  • M59255BFP

  • Vendor: Renesas D/C: 05+& Qty: 1421  Adddate: 2026-08-16
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About M59104

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Datasheet: M59104

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  • M59253FP

  • Vendor: MITSUBISHI D/C: 02+& Qty: 44  Adddate: 2026-08-16
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  • ASK SEMICONDUCTOR LTD   China
    Contact: Mr.Subaninfo@asksemi.com   MSN:asksemiconductor@hotmail.com
    Tel: 86-0755-33060075/0755-29183325/0755-83221176
    Fax: 86-0755-33060076
    (5)
  • M59255BFP

  • Vendor: Renesas D/C: 05+& Qty: 1421  Adddate: 2026-08-16
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  • XENTRON COMPANY LIMITED   China
    Contact: Ms.LiliWan   MSN:xentron1@hotmail.com
    Tel: 86-755-83041490
    Fax: 86-755-83013736
    (0)

About M59MR032C

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Datasheet: M59MR032C

File Size: 360614 KB

Manufacturer: STMICROELECTRONICS [STMicroelectronics]

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M59MR032C General Description

The M59MR032 is a 32 Mbit non-volatile Flash memory that may be erased electrically at block level and programmed in-system on a Word-by-Word basis using a 1.65V to 2.0V VDD supply for the circuitry. For Program and Erase operations the necessary high voltages are generated internally.The device supports synchronous burst read
and asynchronous page mode read from all the blocks of the memory array; at power-up the device is configured for page mode read. In synchronous burst mode, a new data is output at each clock cycle for frequencies up to 54MHz.

The array matrix organization allows each block to be erased and reprogrammed without affecting other blocks. All blocks are protected against programming and erase at Power-up. Blocks can be unprotected to make changes in the application and then reprotected.

Instructions for Read/Reset, Auto Select, Write Configuration Register, Programming, Block Erase, Bank Erase, Erase Suspend, Erase Resume,Block Protect, Block Unprotect, Block Locking,CFI Query, are written to the memory through
a Command Interface (C.I.) using standard microprocessor write timings.

The memory is offered in LFBGA54 and BGA46,0.5 mm ball pitch packages and it is supplied with all the bits erased (set to '1').

M59MR032C Features

` SUPPLY VOLTAGE
    VDD = VDDQ = 1.65V to 2.0V for Program,Erase and Read
     VPP = 12V for fast Program (optional)
` MULTIPLEXED ADDRESS/DATA
`SYNCHRONOUS / ASYNCHRONOUS READ
    Configurable Burst mode Read
    Page mode Read (4 Words Page)
     Random Access: 100ns
` PROGRAMMING TIME
    10s by Word typical
    Double Word Programming Option
` MEMORY BLOCKS
    Dual Bank Memory Array: 8 Mbit - 24 Mbit
     Parameter Blocks (Top or Bottom location)
`DUAL BANK OPERATIONS
    - Read within one Bank while Program or Erase within the other
    No delay between Read and Write operations
` BLOCK PROTECTION/UNPROTECTION
    All Blocks protected at Power-up
    Any combination of Blocks can be protected
` COMMON FLASH INTERFACE (CFI)
` 64 bit SECURITY CODE
` ERASE SUSPEND and RESUME MODES
`100,000 PROGRAM/ERASE CYCLES per BLOCK
`ELECTRONIC SIGNATURE
    Manufacturer Code: 20h
    Top Device Code, M59MR032C: A4h
    Bottom Device Code, M59MR032D: A5h

M59MR032C Connection Diagram

Symbol
Quantity
Value
Unit
TA
Ambient Operating Temperature (2)
-40to85
°C
TBIAS
Temperature Under Bias
-40to125
°C
TSTG
Storage Temperature

-55to155

°C
VIO(3)
Input or Output Voltage
-0.5toVDDQ+0.5
V
VDD,VDDQ
Supply Voltage
-0.5to2.7
V
VPP
Program Voltage
-0.5to13
V

Note: 1. Except for the rating "Operating Temperature Range", stresses above those listed in the Table "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant quality documents.

2. Depends on range.

3. Minimum Voltage may undershoot to 2V during transition and for less than 20ns.

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