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The SCAN182373A is a high performance BiCMOS transparent latch featuring separate data inputs organized into dual 9-bit bytes with byte-oriented latch enable and output enable control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary-Scan Architecture with the incorporation of the defined boundaryscan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).
SCAN182373A Maximum Ratings
Storage Temperature −65 to +150 Ambient Temperature under Bias −55 to +125 Junction Temperature under Bias −55 to +150 VCC Pin Potential to Ground Pin −0.5V to +7.0V Input Voltage (Note 2) −0.5V to +7.0V Input Current (Note 2) −30 mA to +5.0 mA Voltage Applied to Any Output in Disabled or Power-Off State −0.5V to +5.5V in the HIGH State −0.5V to VCC Current Applied to Output in LOW State (Max) Twice the Rated IOL (mA) DC Latchup Source Current −500 mA Over Voltage Latchup (I/O) 10V ESD (HBM) Min 2000V
SCAN182373A Features
IEEE 1149.1 (JTAG) Compliant High performance BiCMOS technology 25 series resistor outputs eliminate need for external terminating resistors Buffered active-low latch enable 3-STATE outputs for bus-oriented applications 25 mil pitch SSOP (Shrink Small Outline Package) Includes CLAMP, IDCODE and HIGHZ instructions Additional instructions SAMPLE-IN, SAMPLE-OUT and EXTEST-OUT Power up 3-STATE for hot insert Member of Fairchild's SCAN Products