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SCANPSC100FSC, SCANPSC100FSCX, SCANPSC110F

Table of contents:
Info of SCANPSC100FSC
Info of SCANPSC100FSCX
Info of SCANPSC110F

SCANPSC100FSC, SCANPSC100FSCX, SCANPSC110F Selling Leads, Datasheet

MFG:Fairchild Semiconductor Category:Integrated Circuits (ICs) Package Cooled:N/A D/C:dc0418

SCANPSC100FSC, SCANPSC100FSCX, SCANPSC110F Datasheet download

Five Points

Part Number: SCANPSC100FSC

Category: Integrated Circuits (ICs)

MFG: Fairchild Semiconductor

Package Cooled: N/A

D/C: dc0418

Description: IC SCAN CTRLR EMB BOUNDRY 28SOIC

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SCANPSC100FSC Parameters

Technical/Catalog Information	SCANPSC100FSC
Vendor	Fairchild Semiconductor
Category	Integrated Circuits (ICs)
Controller Type	Ethernet Controller (IEEE 1149.1 Support)
Interface	Parallel/Serial
Voltage - Supply	4.5 V ~ 5.5 V
Current - Supply	8A
Package / Case	28-SOIC
Packaging	Tube
Operating Temperature	-40°C ~ 85°C
Lead Free Status	Lead Free
RoHS Status	RoHS Compliant
Other Names	SCANPSC100FSC SCANPSC100FSC

SCANPSC100FSC General Description

SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)

SCANPSC100FSC Features

True IEEE1149.1 hierarchical and multidrop addressable capability
The 6 slot inputs support up to 59 unique addresses, a Broadcast Address, and 4 Multi-cast Group Addresses
3 IEEE 1149.1-compatible configurable local scan ports
Mode Register allows local TAPs to be bypassed, selected for insertion into the scan chain individually, or serially in groups of two or three
32-bit TCK counter
16-bit LFSR Signature Compactor
Local TAPs can be tri-stated via the OE# input to allow an alternate test master to take control of the local TAPs

SCANPSC100FSC Typical Application

SCANPSC110F Datasheet

SCANPSC100FSCX Parameters

Technical/Catalog Information	SCANPSC100FSCX
Vendor	Fairchild Semiconductor
Category	Integrated Circuits (ICs)
Controller Type	Ethernet Controller (IEEE 1149.1 Support)
Interface	Parallel/Serial
Voltage - Supply	4.5 V ~ 5.5 V
Current - Supply	8A
Package / Case	28-SOIC
Packaging	Tape & Reel (TR)
Operating Temperature	-40°C ~ 85°C
Drawing Number	*
Lead Free Status	Lead Free
RoHS Status	RoHS Compliant
Other Names	SCANPSC100FSCX SCANPSC100FSCX

SCANPSC110F Parameters

SCANPSC110F Features

True IEEE1149.1 hierarchical and multidrop addressable capability
The 6 slot inputs support up to 59 unique addresses, a Broadcast Address, and 4 Multi-cast Group Addresses
3 IEEE 1149.1-compatible configurable local scan ports
Mode Register allows local TAPs to be bypassed, selected for insertion into the scan chain individually, or serially in groups of two or three
32-bit TCK counter
16-bit LFSR Signature Compactor
Local TAPs can be tri-stated via the OE# input to allow an alternate test master to take control of the local TAPs

SCANPSC110F General Description

SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)

SCANPSC110F Maximum Ratings

If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications.
Supply Voltage (V_CC)                                                                −0.5V to +7.0V
DC Input Diode Current (I_IL)
V_I = −0.5V                                                                                 −20 mA
V_I = V_CC +0.5V                                                                          +20 mA
DC Input Voltage (V_I)                                                                −0.5V to V_CC +0.5V
DC Output Diode Current (I_OK)
V_O = −0.5V                                                                                 −20 mA
V_O = V_CC +0.5V                                                                          +20 mA
DC Output Voltage (V_O)                                                            −0.5V to V_CC+0.5V
DC Output Source/Sink Current (I_O)                                          ±50 mA
DC V_CC or Ground Current                                                         ±50 mA
per Output Pin
DC Latchup Source or Sink Current                                            ±300 mA
Junction Temperature
Ceramic                                                                                      +175°C
Storage Temperature                                                                 −65°C to +150°C
ESD Last Passing Voltage (Min)                                                  4000V

SCANPSC110F Features

True IEEE1149.1 hierarchical and multidrop addressable capability
The 6 slot inputs support up to 59 unique addresses, a Broadcast Address, and 4 Multi-cast Group Addresses
3 IEEE 1149.1-compatible configurable local scan ports
Mode Register allows local TAPs to be bypassed, selected for insertion into the scan chain individually, or serially in groups of two or three
32-bit TCK counter
16-bit LFSR Signature Compactor
Local TAPs can be tri-stated via the OE# input to allow an alternate test master to take control of the local TAPs

SCANPSC110F Typical Application

SCANPSC110F Datasheet

SCANPSC110F Connection Diagram

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