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SCANPSC110FSC_F40, SCANST111MT, SCANSTA111

SCANPSC110FSC_F40, SCANST111MT, SCANSTA111 Selling Leads, Datasheet

MFG:FAIRCHILD  Package Cooled:BGA  D/C:6

SCANPSC110FSC_F40, SCANST111MT, SCANSTA111 Picture

SCANPSC110FSC_F40, SCANST111MT, SCANSTA111 Datasheet download

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Part Number: SCANPSC110FSC_F40

 

MFG: FAIRCHILD

Package Cooled: BGA

D/C: 6

 

 

 
 
 
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  • SCA-14

  • Vendor: Stanford Qty: 5000 Note: stock  Adddate: 2026-06-20
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  • PRO-IC Inc.   South
    Contact: Mr.Bruce Lee   MSN:bsleego@msn.com
    Tel: 82-31-5741420
    Fax: 82-31-5741419
    (97)

About SCA100T

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Datasheet: SCA100T

File Size: 266915 KB

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  • SCA-14

  • Vendor: Stanford Qty: 5000 Note: stock  Adddate: 2026-06-20
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  • PRO-IC Inc.   South
    Contact: Mr.Bruce Lee   MSN:bsleego@msn.com
    Tel: 82-31-5741420
    Fax: 82-31-5741419
    (97)

About SCA100T

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Datasheet: SCA100T

File Size: 266915 KB

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  • SCANSTA111MT/NOPB

  • D/C: 10+& Qty: 10000 Note: our new and original stock in China  Adddate: 2026-06-20
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  • shanghhai xinshen   China
    Contact: Mr.Mrliu   MSN:ldstar8@msn.com
    Tel: 0086-0755-18955684138
    Fax: 0086-0755-22142437
    (22)
  • SCA-14

  • Vendor: Stanford Qty: 5000 Note: stock  Adddate: 2026-06-20
  • Inquire Now
  • PRO-IC Inc.   South
    Contact: Mr.Bruce Lee   MSN:bsleego@msn.com
    Tel: 82-31-5741420
    Fax: 82-31-5741419
    (97)

About SCANSTA111

PDF/DataSheet Download

Datasheet: SCANSTA111

File Size: 522823 KB

Manufacturer: NSC [National Semiconductor]

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SCANSTA111 General Description

The SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules. Each SCANSTA111 supports up to 3 local IEEE1149.1 scan rings which can be accessed individually or combined serially. Addressing is accomplished by loading the instruction register with a value matching that of the Slot inputs. Backplane and inter-board testing can easily be accomplished by parking the local TAP Controllers in one of the stable TAP Controller states via a Park instruction. The 32-bit TCK counter enables built in self test operations to be performed on one port while other scan chains are simultaneously tested.

Reliability Metrics


Part NumberProcessEFR RejectEFR Sample SizePPMLTA RejectsLTA Device HoursFITSMTTF (Hours)
SCANSTA111MTCMOS7016561009540004270700104
SCANSTA111MTXCMOS7016561009540004270700104
SCANSTA111SMCMOS7016561009540004270700104
SCANSTA111SMXCMOS7016561009540004270700104

Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR. The Long Term Failure Rates were calculated at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress temperature of 150°C to an application temperature of 55°C.

For more information on Reliability Metrics, please click here.


Application Notes


TitleSize in KbytesDate
AN-1312: Application Note 1312 Scan Bridge (STA111/STA112) Timing 41 Kbytes 7-Jun-04 Download
AN-1312 (Chinese): Application Note 1312 Scan Bridge (STA111/STA112) Timing
138 Kbytes 
AN-1340: Application Note 1340 Simplified Programming of Xilinx Devices Using a SCANSTA111/112 JTAG Chain Mux 441 Kbytes 13-Jul-05 Download
AN-1340 (Chinese): Application Note 1340 Simplified Programming of Xilinx Devices Using a SCANSTA111/112 JTAG Chain Mux
234 Kbytes 
AN-1327: Application Note 1327 Simplified Programming of Altera FPGA's using a SCANSTA111/112 Scan Chain Mux 64 Kbytes 2-Sep-04 Download
AN-1259: Application Note 1259 SCANSTA112 Designers Reference 533 Kbytes 7-Aug-08 Download

If you have trouble printing or viewing PDF file(s), see Printing Problems.

SCANSTA111 Maximum Ratings

Temperature Min-40 deg C
Temperature Max85 deg C
View Using Catalog

SCANSTA111 Features

True IEEE 1149.1 hierarchical and multidrop addressable capability
The 7 slot inputs support up to 121 unique addresses, an Interrogation Address, Broadcast Address, and 4 Multi-cast Group Addresses (address 000000       is reserved)
3 IEEE 1149.1-compatible configurable local scan ports
Mode Register0 allows local TAPs to be bypassed, selected for insertion into the scan chain individually, or serially in groups of two or three
Transparent Mode can be enabled with a single instruction to conveniently buffer the backplane IEEE 1149.1 pins to those on a single local scan port
LSP ACTIVE outputs provide local port enable signals for analog busses supporting IEEE 1149.4.
General purpose local port passthrough bits are useful for delivering write pulses for FPGA programming or monitoring device status.
Known Power-up state
 TRST on all local scan ports
32-bit TCK counter
16-bit LFSR Signature Compactor
Local TAPs can become TRI-STATE via the OE input to allow an alternate test master to take control of the local TAPs (LSP0-2 have a TRI-STATE notification    output)
3.0-3.6V VCC Supply Operation
  Power-off high impedance inputs and outputs
Supports live insertion/withdrawal

SCANSTA111 Connection Diagram

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