TLRE262A, TLRE50T, TLRE60T Selling Leads, Datasheet
D/C:07+
TLRE262A, TLRE50T, TLRE60T Datasheet download
Part Number: TLRE262A
MFG: --
Package Cooled:
D/C: 07+
D/C:07+
TLRE262A, TLRE50T, TLRE60T Datasheet download
MFG: --
Package Cooled:
D/C: 07+
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PDF/DataSheet Download
Datasheet: TLRE262A
File Size: 135770 KB
Manufacturer: MARKTECH [Marktech Corporate]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: TLRE50T
File Size: 226114 KB
Manufacturer: TOSHIBA [Toshiba Semiconductor]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: TLR.440.
File Size: 107861 KB
Manufacturer: Vishay
Download : Click here to Download
Characteristics | Symbol | Rating | Unit |
Forward current | IF |
50 | mA |
Pulse forward current | VR |
4 | V |
Reverse voltage | PD | 125 | mW |
Operating temperature | Topr | -30~85 | °C |
Storage temperature | Tstg | −40~120 | °C |
Product Name | Forward Current IF (mA) |
Reverse Voltage VR (V) |
Power Dissipation PD (mW) |
Operating Temperature Topr (°C) |
Storage Temperature Tstg (°C) |
TLRE50T | 50 | 4 | 120 | -40~100 | -40~120 |
TLRME50T | 50 | 4 | 120 | ||
TLSE50T | 50 | 4 | 120 | ||
TLOE50T | 50 | 4 | 120 | ||
TLYE50T | 50 | 4 | 120 | ||
TLPYE50T | 50 | 4 | 120 | ||
TLGE50T | 50 | 4 | 120 | ||
TLFGE50T | 50 | 4 | 120 | ||
TLPGE50T | 50 | 4 | 120 |
Product Name |
Forward Current IF (mA) |
Reverse Voltage VR (V) |
Power Dissipation PD (mW) |
Operating Temperature Topr () |
Storage Temperature Tstg () |
TLRE60T(F) TLOE60T(F) TLYE60T(F) TLGE60T(F) |
50 |
4 |
120 |
-40~100 |
-40~120 |
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).