AD10226, AD1022A1, AD1022AARQ Selling Leads, Datasheet
MFG:AD Package Cooled:SSOP-8 D/C:2006
AD10226, AD1022A1, AD1022AARQ Datasheet download
Part Number: AD10226
MFG: AD
Package Cooled: SSOP-8
D/C: 2006
MFG:AD Package Cooled:SSOP-8 D/C:2006
AD10226, AD1022A1, AD1022AARQ Datasheet download
MFG: AD
Package Cooled: SSOP-8
D/C: 2006
Want to post a buying lead? If you are not a member yet, please select the specific/related part number first and then fill the quantity and your contact details in the "Request for Quotation Form" on the left, and then click "Send RFQ".Your buying lead can then be posted, and the reliable suppliers will quote via our online message system or other channels soon.
TOP
PDF/DataSheet Download
Datasheet: AD10226
File Size: 1000123 KB
Manufacturer: AD [Analog Devices]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: AD100
File Size: 130670 KB
Manufacturer: MICROSEMI [Microsemi Corporation]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: AD100
File Size: 130670 KB
Manufacturer: MICROSEMI [Microsemi Corporation]
Download : Click here to Download
VDD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 V
VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 V
Analog Inputs . . . . . . . . . . . . . . . . . . . . . . 5 Vp-p (18 dBm)
Digital Inputs . . . . . . . . . . . . . . . . . .0.5 V to VDD + 0.5 V
Digital Output Current . . . . . . . . . . . . . . . . . . . . . . . 20 mA
Operating Temperature (Ambient) . . . .55°C to +125°C
Storage Temperature (Ambient) . . . . . 65°C to +150°C
Maximum Junction Temperature . . . . . . . . . . . . . . . 150°C
*Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions outside of those indicated in the operation sections of this specification is not implied. Exposure to absolute maximum ratings for extended periods may affect device reliability.