HT7033-1, HT7033A, HT7033A-1 Selling Leads, Datasheet
MFG:HT Package Cooled:SOT-89 D/C:950
HT7033-1, HT7033A, HT7033A-1 Datasheet download
Part Number: HT7033-1
MFG: HT
Package Cooled: SOT-89
D/C: 950
MFG:HT Package Cooled:SOT-89 D/C:950
HT7033-1, HT7033A, HT7033A-1 Datasheet download
MFG: HT
Package Cooled: SOT-89
D/C: 950
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PDF/DataSheet Download
Datasheet: HT7022A
File Size: 166128 KB
Manufacturer: HOLTEK [Holtek Semiconductor Inc]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: HT7033A
File Size: 166128 KB
Manufacturer: HOLTEK [Holtek Semiconductor Inc]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: HT7022A
File Size: 166128 KB
Manufacturer: HOLTEK [Holtek Semiconductor Inc]
Download : Click here to Download
The HT70XXA-1 series is a set of three-terminal low power voltage detectors implemented in CMOS technology. Each voltage detector in the series detects a particular fixed voltage ranging from 2.2V to 5V. The voltage detectors consist of a high-precision and low power consumption standard voltage source, a comparator, hysteresis circuit, and an output driver. CMOS technology ensures low power consumption.
Although designed primarily as fixed voltage detectors, these devices can be used with external components to detect user specified threshold voltages (NMOS open drain type only).
Supply Voltage .............................VSS-0.3V to VSS+26V
Output Voltage ...........................VSS-0.3V to VDD+0.3V
Output Current.....................................................50mA
Storage Temperature .............................-50 to 125
Power Consumption ..........................................200mW
Operating Temperature..............................-40 to 85
Note: These are stress ratings only. Stresses exceeding the range specified under "Absolute Maximum Ratings" may cause substantial damage to the device. Functional operation of this device at other conditions beyond those listed in the specification is not implied and prolonged exposure to extreme conditions may affect device reliability.