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The PLL1705† and PLL1706† are low cost, phase-locked loop (PLL) multiclock generators. The PLL1705 and PLL1706 can generate four system clocks from a 27-MHz reference input frequency. The clock outputs of the PLL1705 can be controlled by sampling frequency-control pins and those of the PLL1706 can be controlled through serial-mode control pins. The device gives customers both cost and space savings by eliminating external components and enables customers to achieve the very low-jitter performance needed for high performance audio DACs and/or ADCs. The PLL1705 and PLL1706 are ideal for MPEG-2 applications which use a 27-MHz master clock such as DVD players, DVD add-on cards for multimedia PCs, digital HDTV systems, and set-top boxes.
PLL1705 Maximum Ratings
Supply voltage: VCC, VDD1VDD3 ...................................................4 V Supply voltage differences: VCC, VDD1VDD3 ..............................±0.1 V Ground voltage differences: AGND, DGND1DGND3 ......................±0.1 V Digital input voltage: FS1 (MD), FS2 (MC), SR (MS), CSEL.............. 0.3 V to (VDD + 0.3) V Analog input voltage, XT1, XT2 ...................................................... 0.3 V to (VCC + 0.3) V Input current (any pins except supplies) ........................................±10 mA Ambient temperature under bias ....................................................40°C to 125°C Storage temperature ......................................................................55°C to 150°C Junction temperature .........................................................................150°C Lead temperature (soldering) ............................................................260°C, 5 s Package temperature (IR reflow, peak) .............................................260°C
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated onditions for extended periods may affect device reliability.