TC40812, TC4081B, TC4081BF Selling Leads, Datasheet
MFG:1812 Package Cooled:SOP14 D/C:05+PB
TC40812, TC4081B, TC4081BF Datasheet download

Part Number: TC40812
MFG: 1812
Package Cooled: SOP14
D/C: 05+PB
MFG:1812 Package Cooled:SOP14 D/C:05+PB
TC40812, TC4081B, TC4081BF Datasheet download

MFG: 1812
Package Cooled: SOP14
D/C: 05+PB
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PDF/DataSheet Download
Datasheet: TC4001
File Size: 197001 KB
Manufacturer: TOSHIBA [Toshiba Semiconductor]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: TC4081BF
File Size: 185808 KB
Manufacturer: TOSHIBA [Toshiba Semiconductor]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: TC4081BF
File Size: 185808 KB
Manufacturer: TOSHIBA [Toshiba Semiconductor]
Download : Click here to Download
TC4081B is positive logic AND gates with two inputs respectively.
Since all the outputs of these gates are equipped with the buffer circuits of inverters, the input/output propagation characteristic has been improved and variation of propagation time caused by increase of load capacity is kept minimum.
DC supply voltage VDD ..................VSS − 0.5~VSS + 20 V
Input voltage VIN ........................VSS − 0.5~VDD + 0.5 V
Output voltage VOUT.................. VSS − 0.5~VDD + 0.5 V
DC input current IIN........................................... ±10 mA
Power dissipation PD ..............300 (DIP)/180 (SOIC) mW
Operating temperature range Tope ..............−40~85
Storage temperature range Tstg................. −65~150
Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).

