2N4150 General Description
• Screening and processing per MIL-PRF-19500 Appendix E
• JAN level (2N4150J)
• JANTX level (2N4150JX)
• JANTXV level (2N4150JV)
• QCI to the applicable level
• 100% die visual inspection per MIL-STD-750 method 2072 for JANTXV
• Radiation testing (total dose) upon request
2N4150 Features
• Hermetically sealed TO-5 metal can
• Also available in chip configuration
• Chip geometry 3101
• Reference document: MIL-PRF-19500/394
2N4150 Typical Application
• General purpose
• Low power, High voltage
• NPN silicon transistor
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