3N171

Features: · Low Switching Voltages· Fast Switching Times· Low Drain-Source Resistance · Low Reverse Transfer CapacitancePinoutSpecifications(TA = 25oC unless otherwise specified)Drain-Gate Voltage . . . . . . . . . . .. . . . . . . . . . . . . . . . ±35VDrain-Source Voltage. . . . . . . . .. . . ....

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3N171 Picture
SeekIC No. : 004230046 Detail

3N171: Features: · Low Switching Voltages· Fast Switching Times· Low Drain-Source Resistance · Low Reverse Transfer CapacitancePinoutSpecifications(TA = 25oC unless otherwise specified)Drain-Gate Voltage ....

floor Price/Ceiling Price

Part Number:
3N171
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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268 Transactions

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Upload time: 2024/3/27

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Product Details

Description



Features:

· Low Switching Voltages
· Fast Switching Times
· Low Drain-Source Resistance
· Low Reverse Transfer Capacitance





Pinout






Specifications

(TA = 25oC unless otherwise specified)
Drain-Gate Voltage . . . . . . . . . . .. . . . . . . . . . . . . . . . ±35V
Drain-Source Voltage. . . . . . . . .. . . . . . . . . . . . . . . . . . . 25V
Gate-Source Voltage . . . . . . .. . . . . . . . . . . . . . . . . . . ±35V
Drain Current . . . . . . . . . . . .. . . . . . . . . . . . . . . . . . . . 30mA
Storage Temperature Range . . . . . . . . . . . -65oC to +200oC
Operating Temperature Range . . . . .. . . . . -55oC to +150oC
Lead Temperature (Soldering, 10sec) .. . . . . . . . . . . +300oC
Power Dissipation . . . . . . . . . . . . . . .. . . . . . . . . . . . 300mW
Derate above 25oC . . . . . . . . . . . . . . . . . . . . . . . 2.4mW/ oC
NOTE: Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions above those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.





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