74LV251N

The 74LV251N belongs to 74LV251 family which is an 8-input multiplexer with 8 binary inputs (I0 to I7), an output enable input (OE) and three select inputs (S0, S1, S2). The 74LV251 is a low-voltage Si-gate CMOS device and is pin and function compatible with 74HC/HCT251. One of the eight binary inputs is selected by the select inputs and is routed to the outputs (Y, Y). Both outputs are in the high impedance OFF-state (Z) when the output enable input is HIGH, allowing multiplexer expansion by tying the outputs.

The features of 74LV251N can be summarized as (1)optimized for low voltage applications: 1.0 to 3.6 V; (2)accepts TTL input levels between VCC = 2.7 V and VCC = 3.6 V; (3)typical VOLP (output ground bounce) < 0.8 V at VCC = 3.3 V, Tamb = 25°C; (4)typical VOHV (output VOH undershoot) > 2 V at VCC = 3.3 V, Tamb = 25°C; (5)true and complement outputs; (6)both outputs are 3-state for further multiplexer expansion; (7)multifunction capability; (8)permits multiplexing from n-lines to one line; (9)output capability: standard; (10)ICC category: MSI.

The absolute maximum ratings of 74LV251N are (1)VCC DC supply voltage: -0.5 to +4.6 V; (2)±IIK DC input diode current(VI <-0.5 or VI > VCC + 0.5V): 20mA; (3)±IOK DC output diode current(VO < -0.5 or VO > VCC + 0.5V): 50mA; (4)±IO DC output source or sink current -bus driver outputs(-0.5V < VO < VCC + 0.5V): 25mA; (5)±IGND, ±ICC DC VCC or GND current for types with bus driver outputs: 50mA; (6)Tstg storage temperature range: -65 to +150 °C; (7)power dissipation per package for temperature range: -40 to +125°C-plastic DIL(above +70°C derate linearly with 12mW/K)/-plastic mini-pack (SO)(above +70°C derate linearly with 8 mW/K)/-plastic shrink mini-pack (SSOP and TSSOP)(above +60°C derate linearly with 5.5 mW/K): 750/500/400mW.(1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under arecommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.)