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ACS27MS

Features: • QML Qualified Per MIL-PRF-38535 Requirements• 1.25 Micron Radiation Hardened SOS CMOS• Radiation Environment- Latch-Up Free Under Any Conditions- Total Dose (Max.) . . . . . . . . . . . . . . . . 3 x 105 RAD(Si)- SEU Immunity. . . . . . . . . . . .<1 x 10-10 Errors...

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SeekIC No. : 004267885 Detail

ACS27MS: Features: • QML Qualified Per MIL-PRF-38535 Requirements• 1.25 Micron Radiation Hardened SOS CMOS• Radiation Environment- Latch-Up Free Under Any Conditions- Total Dose (Max.) . . ...

ACS27MS Data Sheet

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Part Number:
ACS27MS
Supply Ability:
5000

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  • 1~5000
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  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Product Details

Description



Features:

• QML Qualified Per MIL-PRF-38535 Requirements
• 1.25 Micron Radiation Hardened SOS CMOS
• Radiation Environment
- Latch-Up Free Under Any Conditions
- Total Dose (Max.) . . . . . . . . . . . . . . . . 3 x 105 RAD(Si)
- SEU Immunity. . . . . . . . . . . .<1 x 10-10 Errors/Bit/Day
- SEU LET Threshold . . . . . . . . . . . . >100MeV/(mg/cm2)
• Input Logic Levels. . VIL = (0.3)(VCC), VIH = (0.7)(VCC)
• Output Current . . . . . . . . . . . . . . . . . . . .±12mA (Min)
• Quiescent Supply Current . . . . . . . . . . . .  5.0A (Max)
• Propagation Delay . . . . . . . . . . . . . . . . . . .17ns (Max)


Application

• High Speed Control Circuits
• Sensor Monitoring
• Low Power Designs


Pinout

Connection Diagram


Description

The Radiation Hardened ACS27MS is a Triple 3-Input NOR Gate. For each gate, a HIGH level on any input results in a LOW level on the Y output. A LOW level on all inputs results in a HIGH level on the Y output. All inputs are buffered and the outputs are designed for balanced propagation delay and transition times.

The ACS27MS is fabricated on a CMOS Silicon on Sapphire (SOS) process, which provides an immunity to Single Event Latch-up and the capability of highly reliable performance in any radiation environment. These devices offer significant power reduction and faster performance when compared to ALSTTL types.




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