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Part Number: AD53508
Description: The AD53508 is a custom dual-channel parametric measurement circuit for use in semiconductor automatic...


Description: The AD53508 is a custom dual-channel parametric measurement circuit for use in semiconductor automatic...
The AD53508 is a custom dual-channel parametric measurement circuit for use in semiconductor automatic test equipment.It contains programmable modes to force a pin voltage and measure its current or to integrate and hold a current value.Alternatively, a current can be forced and the compliance voltage measured.
The device provides a remote force/sense capability to ensure accuracy at the tester pin. A guard output is available to drive the shield of a force/sense pair.
Two input references per channel permit controlled switching to different voltage or current levels. The forced voltage or current levels can be switched back to the measurement system to read back the analog levels for system calibration.
The circuit is powered by +15 V, +5 V, and 10 V supplies and dissipates 230 mW nominally.
| Parameter |
Min |
Max |
Unit |
Condition |
| VDD to VEE |
-0.3 |
+26.4 |
V |
|
| VCC to VEE |
-0.3 |
+26.4 |
V |
|
| VDD to DGND |
0.3 |
+6.0 |
V |
|
| Digital Inputs to DGND |
-0.3 |
VCC+0.3 |
V |
|
| Power Dissipation |
700 |
mW |
TA 75°C | |
| Operating Temperature Range |
25 |
70 |
°C |
|
| Storage Temperature |
-60 |
+125 |
°C |
|
| Lead Temperature | 300 | °C | Soldering (10 sec) | |
| Force/Sense Outputs |
VEE0.8 |
+150 |
V |
*Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
AD53508
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