BM29F400B

Features: 5.0V +/- 10% Program and Erase - Minimizes system-level power requirements High performance - 90 nS access time Compatible with JEDEC-standard Commands - Uses software commands, pinouts, and packages following industry standards for single power supply Flash memory Typically 100,000...

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SeekIC No. : 004300860 Detail

BM29F400B: Features: 5.0V +/- 10% Program and Erase - Minimizes system-level power requirements High performance - 90 nS access time Compatible with JEDEC-standard Commands - Uses software commands, pinout...

floor Price/Ceiling Price

Part Number:
BM29F400B
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/4/26

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Product Details

Description



Features:

 5.0V +/- 10% Program and Erase
    - Minimizes system-level power requirements  High performance
    - 90 nS access time 
Compatible with JEDEC-standard Commands
    - Uses software commands, pinouts, and  packages following industry
   standards for   single power supply Flash memory 
Typically 100,000 Program/Erase Cycles 
Sector Erase Architecture
   - One 16 Kbytes, two 8 Kbytes, one 32 Kbytes, and seven 64 Kbytes
   - Any combination of sectors can be erased  concurrently;
     also supports full chip erase 
Erase Suspend/Resume
   - Suspend a sector erase operation to allow a data read in a sector
     not being erased within the same device 
 Ready/Busy
   - RY/BY output pin for detection of programming or erase cycle completion
 RESET 
   - Hardware pin resets the internal state machine to the read mode 
Internal Erase Algorithms
   - Automatically erases a sector, any combination of sectors,or the entire chip 
 Internal Programming Algorithms
   - Automatically programs and verifies data at a specified address 
 Low Power Consumption
   - 20 mA typical active read current for Byte Mode 
   - 28 mA typical active read current for Word Mode 
   - 30 mA typical write/erase current 
Sector Protection
  - Hardware method disables any combination 
    of sectors from a program or erase operation 
 Boot Code Sector Architecture 
 




Pinout

  Connection Diagram


Specifications

PARAMETER

RATING

UNIT

Storage Temperature
Plastic Packages

-65 to +125

 

Ambient Temperature
With Power Applied

-55 to +125

 

Voltages with Respect to Ground
All pins except A9 (Note 1)
Vcc (Note 1); A9 (Note 2)

-2 to +7
-2 to +7
-2 to +14

V

Output Short Circuit Current (Note 4)

200

mA




Description

The BM29F400 is an 4 Megabit, 5.0 volt-only CMOS Flash memory device organized as a 512  Kbytes of 8-bits each, or 256 Kbytes of 16 bits each. The device is offered in standard 48-pin TSOP  package. It is designed to be programmed and erased in-system with a 5.0 volt power-supply and can  also be reprogrammed in standard EPROM programmers.

With access times of 90 nS, 120 nS, and 150 nS, the BM29F400 has separate chip enable CE, write  enable WE, and output enable OE controls. BMI's memory devices reliably store memory data even  after 100,000 program and erase cycles.

The BM29F400 is entirely pin and command set compatible with the JEDEC standard for 4 Megabit  Flash memory devices. Commands are written to the command register using standard  microprocessor write timings. Register contents of BM29F400B serve as input to an internal state-machine which  controls the erase and programming circuitry. Write cycles also internally latch addresses and data  needed for the programming and erase operations.

The BM29F400 is programmed by executing the program command sequence. BM29F400B will start the  internal byte/word programming algorithm that automatically times the program pulse width and also  verifies the proper cell margin. Erase is accomplished by executing either the sector erase or chip  erase command sequence. This will start the internal erasing algorithm that automatically times the  erase pulse width and also verifies the proper cell margin. No preprogramming is required prior to  execution of the internal erase algorithm. Sectors of the BM29F400 Flash memory array are  electrically erased via Fowler-Nordheim tunneling. Bytes/words are programmed one byte/word at a  time using a hot electron injection mechanism.

The BM29F400 features a sector erase architecture. The BM29F400B memory array is divided into one 16  Kbytes, two 8 Kbytes, one 32 Kbytes, and seven 64 Kbytes. Sectors can be erased individually or in  groups without affecting the data in other sectors. Multiple sector erase and full chip erase capabilities add flexibility to altering the data in the device. To protect this data of BM29F400B from accidental program and
erase, the device also has a sector protect function. This function hardware write protects the selected sector(s). The sector protect and sector unprotect features can be enabled in a PROM programmer.

For read, program and erase operation, the BM29F400 needs a single 5.0 volt power-supply. Internally generated and well regulated voltages are provided for the program and erase operation. A low Vcc detector inhibits write operations on loss of power. End of program or erase of BM29F400B is detected by the Ready/Busy status pin, Data Polling of DQ7, or by the Toggle Bit I feature on DQ6. Once the program or erase cycle has been successfully completed, the device internally resets to the Read mode.

The BM29F400 also has a hardware RESET  pin. Driving the RESET  pin low during execution of an Internal Programming or Erase command will terminate the operation and reset the device to the Read mode. The RESET pin may be tied to the system reset circuitry, so that the system will have access to boot code upon completion of system reset, even if the Flash device BM29F400B is in the process of an Internal Programming or Erase operation. If the BM29F400B is reset using the  RESET pin during an Internal Programming or Erase operation, data in the address locations on which the internal state machine is operating will be erroneous. Thus, these address locations will needrewriting after the device is reset.




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