BTA216-600E

Triacs RAIL TRIAC

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SeekIC No. : 00203321 Detail

BTA216-600E: Triacs RAIL TRIAC

floor Price/Ceiling Price

Part Number:
BTA216-600E
Mfg:
NXP Semiconductors
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/4/27

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Product Details

Quick Details

Rated Repetitive Off-State Voltage VDRM : 600 V Off-State Leakage Current @ VDRM IDRM : 0.5 mA
Gate Trigger Voltage (Vgt) : 1.5 V Gate Trigger Current (Igt) : 10 mA
Holding Current (Ih Max) : 25 mA Mounting Style : Through Hole
Package / Case : TO-220AB Packaging : Rail    

Description

Breakover Current IBO Max :
On-State RMS Current (It RMS) :
Rated Repetitive Off-State Voltage VDRM : 600 V
Mounting Style : Through Hole
Package / Case : TO-220AB
Gate Trigger Current (Igt) : 10 mA
Gate Trigger Voltage (Vgt) : 1.5 V
Off-State Leakage Current @ VDRM IDRM : 0.5 mA
Packaging : Rail
Holding Current (Ih Max) : 25 mA


Pinout

  Connection Diagram


Specifications

SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
VDRM Repetitive peak off-state voltages   - 600 V
IT(RMS) RMS on-state current full sine wave;Tmb 99 ˚C - 16 A
ITSM Non-repetitive peak on-state current full sine wave; Tj = 25 ˚C prior to surge
t = 20 ms
t = 16.7 ms
-
-
140
150
A
A
I2t I2t for fusing t = 10 ms - 98 A2s
dIT/dt Repetitive rate of rise of on-state current after triggering ITM = 12 A; IG = 0.2 A;
dIG/dt =0.2 A/µs
-
100 A/µs
IGM Peak gate current over any 20 ms period - 2 A
PGM Peak gate power - 5 W
PG(AV) Average gate power - 0.5 W
Tstg Storage temperature -40 150 ˚C
Tj Operating junction temperature - 125 ˚C



Description

Passivated guaranteed commutationtriacs BTA216-600E in a plastic envelope intended for use in motor control circuits or with other highly inductive loads. BTA216-600E balance the requirements of commutation performance and gate sensitivity. The "sensitive gate" E series and "logic level" D series are intended for interfacing with low power drivers, including micro controllers.




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