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DS2174

Features: · Generates and detects digital patterns for analyzing and trouble-shooting digital communications systems· Programmable polynomial length and feedback taps for generation of any pseudorandom patterns up to 232 - 1; up to 32 taps can be used in the feedback path· Programmable, user-defin...

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SeekIC No. : 004328807 Detail

DS2174: Features: · Generates and detects digital patterns for analyzing and trouble-shooting digital communications systems· Programmable polynomial length and feedback taps for generation of any pseudoran...

DS2174 Data Sheet

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Part Number:
DS2174
Supply Ability:
5000

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  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Product Details

Description



Features:

· Generates and detects digital patterns for analyzing and trouble-shooting digital communications systems
· Programmable polynomial length and feedback taps for generation of any pseudorandom patterns up to 232 - 1; up to 32 taps can be used in the feedback path
· Programmable, user-defined pattern registers for long repetitive patterns up to 512 bytes in length
· Large 48-bit count and bit error count registers
· Software-programmable bit error insertion
· Fully independent transmit and receive paths
· 8-bit parallel-control port
· Detects polynomial test patterns in the presence of bit error rates up to 10-2
· Programmable for serial, 4-bit parallel, or 8-bit parallel data interfaces
· Serial mode clock rate is 155MHz; byte mode is 80MHz for a net 622Mbps; OC-3
· Available in 44-pin PLCC


Application

· Routers
· Channel Service Units (CSUs)
· Data Service Units (DSUs)
· Muxes
· Switches
· Digital-to-Analog Converters (DACs)
· CPE Equipment
· Bridges
· Smart Jack


Pinout

Connection Diagram


Specifications

Voltage Range on Any Pin Relative to Ground                 -1.0V to +5.5V
Operating Temperature Range for DS2174QN                -40 to +85
Storage Temperature Range                                        -55 to +125
Soldering Temperature Range                      See IPC/JEDEC J-STD-020A


Description

The DS2174 enhanced bit error rate tester (EBERT) is a software-programmable test-pattern generator, receiver, and analyzer capable of meeting the most stringent error-performance requir ements of digital transmission facilities. It features bit-serial, nibble-parallel, and byte-parallel data interfaces, and generates and uniquely synchronizes to pseudorandom patterns of the form 2n - 1, where n can take on values from 1 to 32, and user-defined repetitive patterns of any length up to 512 octets.




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