E710AHF

Features:

• Fully Integrated Three-Statable Driver, Window Comparator, and Dynamic Active Load
• 12V Driver, Load, Compare Range
• 13V Super Voltage Capable
• ± 35 mA Programmable Load
• Comparator Input Tracking >6V/ns
• Leakage (L+D+C) < 1 µA (normal mode)
• Leakage (L+D+C) < 25 nA (IPD mode)
• Small footprint (52 pin MQFP)


Application

•   VLSI Test Equipment
•   Mixed-Signal Test Equipment
•   Memory Testers (Bidirectional Channels)
•   ASIC Verifiers


Pinout




Description

The Edge710 is a totally monolithic ATE pin electronics solution manufactured in a high-performance complementary bipolar process. In Automatic Test Equipment (ATE) applications, the Edge710 incorporates a driver, a load, and a window comparator suitable for very fast bidirectional channels in VLSI, Mixed-Signal, and Memory test systems.

The Edge710 three-statable driver is capable of generating 9V swings over a 12V range. In addition, 13V super voltage may be obtained under certain operating conditions. Separate rise and fall edge adjustments support both high speed and low speed applications, and allow for superior rise and fall time matching. An input power down mode allows extremely low leakage current in HiZ.

The load supports programmable source and sink currents of ± 35 mA over a 12V range, or Edge710 can be completely disabled. The source current, sink current, and commutating voltage are all independently set. In addition,the load is configurable and may be used as a programmable voltage clamp.

The Edge710 window comparator spans a 12V common mode range, tracks input signals with edge rates greater than 6 V/ns, and passes sub-ns pulses. An input power down mode allows for extremely low leakage measurements.

The Edge710 inclusion of all pin electronics building blocks into a 52 lead MQFP (10 mm body w/ internal heat spreader) offers a highly integrated solution that is traditionally implemented with multiple integrated circuits or discretes.