EH29

The specified reference or "center" frequency of the oscillator. Typically specified in megahertz (MHz)or kilohertz (kHz).

The maximum and minimum temperatures that the oscillator device can be exposed to during oscillation. Over thistemperature range, all of the specified device operatingparameters are guaranteed.

The amount of current consumption by an oscillator from the powersupply, typically specified in milliamps (mA).

Defined as the Output Voltage Logic Low or "Logic 0" (Figure 1 in oscillator glossary of terms).

The Rise Time, measured in nanoseconds (nSec), is defined as thetransition time from an output logic low to an output logic high.Conversely, the Fall Time, also measured in nanoseconds (nSec), isdefined as the transition time from an output logic high to an outputlogic low. This transition time is measured at specified voltagethresholds or at specified percentages of the output waveformamplitude (Figure 1 in the oscillator glossary of terms).

The systematic change in frequency with time due to internal changes in the crystal. Aging is often expressed as a maximum value in parts per million per year (ppm/yr). The rate of aging is typically greatest during the first 30 to 60 days after which time the aging rate decreases. The following factors effect crystal aging: adsorption and desorption of contamination on the surfaces of the quartz, stress relief of the mounting and bonding structures, material outgassing, and seal integrity.