ELH00338001401ZX

Features: Slew rate1500 VmsOutput drive100 mARise and fall times29 nsInput resistance1011Power bandwidth100 MHzMIL-STD-883 devices 100% manufactured in USA PinoutSpecifications VS ab b SupplyVoltage(V+- V -) 40V TA OperatingTemperatureRange VIN InputVoltage 40V ...

product image

ELH00338001401ZX Picture
SeekIC No. : 004335780 Detail

ELH00338001401ZX: Features: Slew rate1500 VmsOutput drive100 mARise and fall times29 nsInput resistance1011Power bandwidth100 MHzMIL-STD-883 devices 100% manufactured in USA PinoutSpecifications VS ab b S...

floor Price/Ceiling Price

Part Number:
ELH00338001401ZX
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

SeekIC Buyer Protection PLUS - newly updated for 2013!

  • Escrow Protection.
  • Guaranteed refunds.
  • Secure payments.
  • Learn more >>

Month Sales

268 Transactions

Rating

evaluate  (4.8 stars)

Upload time: 2024/4/28

Payment Methods

All payment methods are secure and covered by SeekIC Buyer Protection PLUS.

Notice: When you place an order, your payment is made to SeekIC and not to your seller. SeekIC only pays the seller after confirming you have received your order. We will also never share your payment details with your seller.
Product Details

Description



Features:

 Slew rate1500 Vms
 Output drive100 mA
 Rise and fall times29 ns
 Input resistance1011
 Power bandwidth100 MHz
 MIL-STD-883 devices 100% manufactured in USA

 




Pinout

  Connection Diagram


Specifications

VS
ab b
SupplyVoltage(V+- V -)
40V
TA
OperatingTemperatureRange
 
VIN
InputVoltage
40V
 
ELH0033
-55to+125
PD
PowerDissipation(SeeCurves)
1.5W
TJ
OperatingJunctionTemperature
175
IOC
ContinuousOutputCurrent
±100mA
TST
StorageTemperature
-65to+150
IOP
PeakOutputCurrent
±250mA
 
LeadTemperature
 
 
 
 
 
(Soldering10seconds)
300

Important Note
All parameters having MinMax specifications are guaranteed The Test Level column indicates the specific device testing actually performed during production and Quality inspection Elantec performs most electrical tests using modern high-speed automatic testee equipment specifically the LTX77 Series system Unless otherwise noted all tests are pulsed tests therefore TJ =TC =TA

Test Level Test Procedure
I              100% production tested and QA sample tested per QA test plan QCX0002
II             100%productiontestedatTA 25andQAsampletestedatTA 25T andTA perQAtestplanQCX0002MAX MIN
III           QAsampletestedperQAtestplanQCX0002
IV            Parameterisguaranteed(butnottested)byDesignandCharacterizationData
V             ParameteristypicalvalueatT 25 forinformationpurposesonly






Description

The ELH0033 is a high-speed FET input voltage follower buffer designed to provide high output currents from DC to over100 MHz The ELH0033 slews at 1500 Vms and will drive 100X loads Phase linearity is excellent to 20 MHz allowing the buffer to be included in op amp loops

The ELH0033 is intended to fulfill a wide range of buffer applications such as high-speed line drivers video impedance trans-formation nuclear instrumentation amplifiers op amp isolation buffers for driving reactive loads and high impedance input buffers for high-speed A to D's and comparators

These devices are constructed using specially selected junction FETs and active laser trimming to achieve guaranteed performance specifications The ELH0033 is specified for operation from -55to +125

Elantec facilities comply with MIL-I-45208A and other applicable quality specifications Elantec's Military devices are 100%
fabricated and assembled in our rigidly controlled ultra-cleanfacilities in Milpitas California For additional information on  Elantec's Quality and Reliability Assurance policy and procedures request brochure QRA-1




Customers Who Bought This Item Also Bought

Margin,quality,low-cost products with low minimum orders. Secure your online payments with SeekIC Buyer Protection.
Prototyping Products
DE1
Cable Assemblies
Crystals and Oscillators
Power Supplies - Board Mount
Test Equipment
View more