EPM7256AE General Description
EPM7256AE Maximum Ratings
EPM7256AE Features
High-performance 3.3-V EEPROM-based programmable logic devices (PLDs) built on second-generation Multiple Array MatriX (MAX® ) architecture (see Table 1)
3.3-V in-system programmability (ISP) through the built-in IEEE Std. 1149.1 Joint Test Action Group (JTAG) interface with advanced pin-locking capability
Built-in boundary-scan test (BST) circuitry compliant with IEEE Std. 1149.1
Supports JEDEC Jam Standard Test and Programming Language (STAPL) JESD-71
Enhanced ISP features
Enhanced ISP algorithm for faster programming (excluding EPM7128A and EPM7256A devices)
ISP_Done bit to ensure complete programming (excluding EPM7128A and EPM7256A devices)
Pull-up resistor on I/O pins during in-system programming
Pin-compatible with the popular 5.0-V MAX 7000S devices
High-density PLDs ranging from 600 to 10,000 usable gates
4.5-ns pin-to-pin logic delays with counter frequencies of up to 227.3 MHz
EPM7256AE Connection Diagram
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