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Part Number: FDG6301N
Description: These dual N-Channel logic level enhancement mode field effect transistors are produced using Fairchil...


Description: These dual N-Channel logic level enhancement mode field effect transistors are produced using Fairchil...
These dual N-Channel logic level enhancement mode field effect transistors are produced using Fairchild's proprietary, high cell density, DMOS technology. This very high density process is especially tailored to minimize on-state resistance. This device has been designed especially for low voltage applications as a replacement for bipolar digital transistors and small signal MOSFETs.
|
Symbol |
Parameter |
FDG6301N |
Units | |
|
VDSS VGSS |
Drain-Source Voltage Gate-Source Voltage |
25 8 0.22 0.65 0.3 -55 to 150 6.0 |
V V A W °C kV | |
|
ID |
Drain Current Continuous Pulsed | |||
|
PD |
Power Dissipation for Single Operation | (Note 1) | ||
| TJ,TSTG ESD |
Operating and Storage Junction Temperature Range Electrostatic Discharge Rating MIL-STD-883D Human Body Model (100pf/1500Ohm) | |||
| RJA | Thermal Resistance, Junction-to-Ambient |
415 |
°C/W |
FDG6301N
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