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Part Number: FDG6301N

 

 

 

 

Description: These dual N-Channel logic level enhancement mode field effect transistors are produced using Fairchil...


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FDG6301N General Description


These dual N-Channel logic level enhancement mode field effect transistors are produced using Fairchild's proprietary, high cell density, DMOS technology. This very high density process is especially tailored to minimize on-state resistance. This device has been designed especially for low voltage applications as a replacement for bipolar digital transistors and small signal MOSFETs.

FDG6301N Maximum Ratings

Symbol
Parameter
FDG6301N
Units
VDSS
VGSS
Drain-Source Voltage
Gate-Source Voltage
25
8
0.22
0.65
0.3
-55 to 150
6.0
V
V
A

W
°C
kV
ID
Drain Current Continuous
Pulsed
PD
Power Dissipation for Single Operation (Note 1)
TJ,TSTG
ESD
Operating and Storage Junction Temperature Range
Electrostatic Discharge Rating MIL-STD-883D Human Body
Model (100pf/1500Ohm)

THERMAL CHARACTERISTICS
RJA Thermal Resistance, Junction-to-Ambient
415
°C/W

FDG6301N Features

·25 V, 0.22 A continuous, 0.65 A peak. RDS(ON) = 4 W @ VGS= 4.5 V, RDS(ON) = 5 W @ VGS= 2.7 V.
·Very low level gate drive requirements allowing direct operation in 3 V circuits (VGS(th) < 1.5 V).
·Gate-Source Zener for ESD ruggedness (>6kV Human Body Model).
·Compact industry standard SC70-6 surface mount package.

FDG6301N Connection Diagram

FDG6301N  Connection Diagram

FDG6301N datasheet

FDG6301N
PDF/DataSheet Download

  • Datasheet: FDG6301N
  • File Size: 232050 KB
  • Manufacturer: FAIRCHILD [Fairchild Semiconductor]
  • Click here to Download

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