FSYE430D

Features: • 3A, 500V, rDS(ON) = 2.70• Total Dose - Meets Pre-RAD Specifications to 100K RAD (Si)• Single Event - Safe Operating Area Curve for Single Event Effects - SEE Immunity for LET of 36MeV/mg/cm2 with VDS up to 80% of Rated Breakdown and VGS of 10V Off-Bias• Dose Rat...

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SeekIC No. : 004344943 Detail

FSYE430D: Features: • 3A, 500V, rDS(ON) = 2.70• Total Dose - Meets Pre-RAD Specifications to 100K RAD (Si)• Single Event - Safe Operating Area Curve for Single Event Effects - SEE Immunity f...

floor Price/Ceiling Price

Part Number:
FSYE430D
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/5/2

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Product Details

Description



Features:

• 3A, 500V, rDS(ON) = 2.70
• Total Dose
   - Meets Pre-RAD Specifications to 100K RAD (Si)
• Single Event
   - Safe Operating Area Curve for Single Event Effects
   - SEE Immunity for LET of 36MeV/mg/cm2 with VDS up to 80% of Rated Breakdown and VGS of 10V Off-Bias
• Dose Rate
   - Typically Survives 3E9 RAD (Si)/s at 80% BVDSS
   - Typically Survives 2E12 if Current Limited to IDM
• Photo Current
   - 8nA Per-RAD(Si)/s Typically
• Neutron
   - Maintain Pre-RAD Specifications for 3E12 Neutrons/cm2
   - Usable to 3E13 Neutrons/cm2



Specifications

   
FSYE430D, FSYE430R
UNITS
Drain to Source Voltage
VDS
500
V
Drain to Gate Voltage (RGS = 20k)
VDGR
500
V
Continuous Drain Current
TC = 25oC
ID
3
A
TC = 100oC
ID
2
A
Pulsed Drain Current
IDM
9
A
Gate to Source Voltage
VGS
±20
V
Maximum Power Dissipation
TC = 25oC
PT
42
W
TC = 100oC
PT
17
W
Linear Derating Factor
0.33
W/oC
Single Pulsed Avalanche Current, L = 100µH, (See Test Figure)
IAS
9
A
Continuous Source Current (Body Diode)
IS
3
A
Pulsed Source Current (Body Diode)
ISM
9
A
Operating and Storage Temperature
TJ, TSTG
-55 to 150
oC
Lead Temperature (During Soldering)
TL
300
oC
(Distance >0.063in (1.6mm) from Case, 10s Max)



Description

The Discrete Products Operation of Intersil FSYE430D has developed a series of Radiation Hardened MOSFETs specifically designed for commercial and military space applications. Enhanced Power MOSFET immunity to Single Event Effects (SEE), Single Event Gate Rupture (SEGR) in particular, is combined with 100K RADS of total dose hardness FSYE430D to provide devices which are ideally suited to harsh space environments. The dose rate and neutron tolerance necessary for military applications have not been sacrificed.

The Intersil portfolio of SEGR resistant radiation hardened MOSFETs FSYE430D includes N-Channel and P-Channel devices in a variety of voltage, current and on resistance ratings. Numerous packaging options are also available.

This MOSFET FSYE430D is an enhancement-mode silicon-gate power field-effect transistor of the vertical DMOS (VDMOS) structure.FSYE430D is specially designed and processed to be radiation tolerant. The MOSFET is well suited for applications exposed to radiation environments such as switching regulation, switching converters, motor drives, relay drivers and drivers for high-power bipolar switching transistors requiring high speed and low gate drive power. FSYE430D can be operated directly from integrated circuits.

Reliability screening FSYE430D is available as either commercial, TXV equivalent of MIL-S-19500, or Space equivalent of MIL-S-19500. Contact Intersil for any desired deviations from the data sheet.




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