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Part Number: GTL2007

 

 

 

 

Description: The GTL2007 is a customized translator between dual Xeon processors, Platform Health Management, South...


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GTL2007 General Description


The GTL2007 is a customized translator between dual Xeon processors, Platform Health Management, South Bridge and Power Supply LVTTL and GTL signals.

The GTL2007 is derived from the GTL2006 with an enable function added that disables the error output to the monitoring agent for platforms that monitor the individual error conditions from each processor. This enable function can be used so that false error conditions are not passed to the monitoring agent when the system is unexpectedly powered down. This unexpected power-down could be from a power supply overload, a CPU thermal trip, or some other event of which the monitoring agent is unaware. A typical implementation would be to connect each enable line to the system power good signal or the individual enables to the VRD power good for each processor.

The Nocona and Dempsey/Blackford Xeon processors specify a VTT of 1.2 V and 1.1 V, as well as a nominal Vref of 0.76 V and 0.73 V respectively. To allow for future voltage level changes that may extend Vref to 0.63 of VTT (minimum of 0.693 V with VTT of 1.1 V) the GTL2009 allows a minimum Vref of 0.66 V. Characterization results show that there is little DC or AC performance variation between these levels.

The GTL2007 is the companion chip to the GTL2009 3-bit GTL Front-Side Bus frequency comparator that is used in dual-processor Xeon applications.

GTL2007 Maximum Ratings

Symbol Parameter Conditions Min Max Unit
VCC DC supply voltage   -0.5 +4.6 V
IIK input clamping diode current VI < 0 V - -50 mA
VI DC input voltage A port (LVTTL) -0.5 [3] +4.6 V
B port (GTL) -0.5 [3] +4.6 V
IOK output diode clamping current VO < 0 V - -50 mA
VO DC output voltage output in OFF or HIGH state;
A port
-0.5 [3] +4.6 V
output in OFF or HIGH state;
B port
-0.5 [3] +4.6 V
IOL current into any output in the LOW state A port - 32 mA
B port - 30 mA
IOH current into any output in the HIGH state A port - -32 mA
Tstg storage temperature   -60 +150
Tj(max) maximum junction temperature   [2] - +125

[1] Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under Section 10 "Recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
[2] The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150.
[3] The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed.

GTL2007 Features

· Operates as a GTL to LVTTL sampling receiver or LVTTL to GTL driver
· 3.0 V to 3.6 V operation
· LVTTL I/O not 5 V tolerant
· Series termination on the LVTTL outputs of 30 W
· ESD protection exceeds 2000 V HBM per JESD22-A114, 200 V MM per JESD22-A115, and 1000 V CDM per JESD22-C101
· Latch-up testing is done to JEDEC Standard JESD78 which exceeds 500 mA
· Package offered: TSSOP28

GTL2007 Connection Diagram

GTL2007  Connection Diagram

GTL2007 datasheet

GTL1655DGG
PDF/DataSheet Download

  • Datasheet: GTL1655DGG
  • File Size: 130387 KB
  • Manufacturer: PHILIPS [Philips Semiconductors]
  • Click here to Download

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