GTL2008

Features: · Operates as a GTL to LVTTL sampling receiver or LVTTL to GTL driver· EN1 and EN2 disable error output· All LVTTL and GTL outputs are put in a high-impedance state when EN1 and EN2 are LOW· 3.0 V to 3.6 V operation· LVTTL I/O not 5 V tolerantPinoutSpecifications Symbol Parameter...

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GTL2008 Picture
SeekIC No. : 004357104 Detail

GTL2008: Features: · Operates as a GTL to LVTTL sampling receiver or LVTTL to GTL driver· EN1 and EN2 disable error output· All LVTTL and GTL outputs are put in a high-impedance state when EN1 and EN2 are LO...

floor Price/Ceiling Price

Part Number:
GTL2008
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/4/30

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Product Details

Description



Features:

· Operates as a GTL to LVTTL sampling receiver or LVTTL to GTL driver
· EN1 and EN2 disable error output
· All LVTTL and GTL outputs are put in a high-impedance state when EN1 and EN2 are LOW
· 3.0 V to 3.6 V operation
· LVTTL I/O not 5 V tolerant



Pinout

  Connection Diagram


Specifications

Symbol Parameter Conditions RATING Unit
VCC supply voltage   -0.5 +4.6 V
IIK input clamping
current
VI < 0 V -50 mA
VI input voltage A port (LVTTL)
B port (GTL)
[1] -0.5 +4.6
-0.5[1] +4.6
V
IOK output clamping
current
VO < 0 V -50 mA
VO output voltage output in OFF or HIGH state; A port
output in OFF or HIGH state;B port
[1] -0.5 +4.6 V
IOL LOW-level output current[2] A port
B port
32
30
mA
IOH HIGH-level output current[3] A port -32 mA
Tstg storage temperature   -65 +150 °C
Tj(max) maximum junction temperature   [4] +125 °C

[1] The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings areobserved.
[2] Current into any output in the LOW state.
[3] Current into any output in the HIGH state.
[4] The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150 °C.




Description

The GTL2008/GTL2107 is a customized translator between dual Xeon processors, Platform Health Management, South Bridge and Power Supply LVTTL and GTL signals. Functionally and footprint identical to the GTL2007, the GTL2008/GTL2107 LVTTL and GTL outputs were changed to put them into a high-impedance state when EN1 and EN2 are LOW, with the exception of 11BO because its normal state is LOW, so it is forced LOW. EN1 and EN2 will remain LOW until VCC is at normal voltage, the other inputs of GTL2008/GTL2107 are in valid states and VREF is at its proper voltage to assure that the outputs will remain high-impedance through power-up.

Both the GTL2008/GTL2107 and the GTL2007 are derived from the GTL2006. They add an enable function that disables the error output to the monitoring agent for platforms that monitor the individual error conditions from each processor. This enable function of GTL2008/GTL2107 can be used so that false error conditions are not passed to the monitoring agent when the system is unexpectedly powered down. This unexpected power-down could be from a power supply overload, a CPU thermal trip, or some other event of which the monitoring agent is unaware.

A typical implementation of GTL2008/GTL2107 would be to connect each enable line to the system power good signal or the individual enables to the VRD power good for each processor.

Typically Xeon processors specify a VTT of 1.1 V to 1.2 V, as well as a nominal Vref of 0.73 V to 0.76 V. To allow for future voltage level changes that may extend Vref to 0.63 of VTT (minimum of 0.693 V with VTT of 1.1 V) the GTL2008/GTL2107 allows a minimum Vref of 0.66 V. Characterization results show that there is little DC or AC performance variation between these levels.

The GTL2008 is the companion chip to the GTL2009 3-bit GTL Front-Side Bus frequency comparator that is used in dual-processor Xeon applications.

The GTL2107 is the Intel designation for the GTL2008.




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