Purchase HY5PS1G431CFP, In-stock HY5PS1G431CFP From SeekIC.


| Symbol | Parameter | Rating | Units | Notes |
| VDD | Voltage on VDD pin relative to Vss | - 1.0 V ~ 2.3 V | V | 1 |
| VDDQ | Voltage on VDDQ pin relative to Vss | - 0.5 V ~ 2.3 V | V | 1 |
| VDDL | Voltage on VDDL pin relative to Vss | - 0.5 V ~ 2.3 V | V | 1 |
| VIN, VOUT | Voltage on any pin relative to Vss | - 0.5 V ~ 2.3 V | V | 1 |
| II | Input leakage current; any input 0V VIN VDD; all other balls not under test = 0V) |
-2 uA ~ 2 uA | uA | |
| IOZ | Output leakage current; 0V VOUT VDDQ; DQ and ODT disabled |
-5 uA ~ 5 uA | uA | |
| TSTG | Storage Temperature | -55 to +100 | 1,2 |
Note:
1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
2. Storage Temperature is the case surface temperature on the /top side of the DRAM. For the measurement conditions. please refer to JESD51-2 standard.
HY50P
PDF/DataSheet Download








