HYB25D256161CE-5

Features: • Double data rate architecture: two data transfers per clock cycle• Bidirectional data strobe (DQS) is transmitted and received with data, to be used in capturing data at the receiver• DQS is edge-aligned with data for reads and is center-aligned with data for writes&#...

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SeekIC No. : 004368762 Detail

HYB25D256161CE-5: Features: • Double data rate architecture: two data transfers per clock cycle• Bidirectional data strobe (DQS) is transmitted and received with data, to be used in capturing data at the ...

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Part Number:
HYB25D256161CE-5
Supply Ability:
5000

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  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/4/27

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Product Details

Description



Features:

• Double data rate architecture: two data transfers per clock cycle
• Bidirectional data strobe (DQS) is transmitted and received with data, to be used in capturing data at the receiver
• DQS is edge-aligned with data for reads and is center-aligned with data for writes
• Differential clock inputs (CK and CK)
• Four internal banks for concurrent operation
• Data mask (DM) for write data
• DLL aligns DQ and DQS transitions with CK transitions
• Commands entered on each positive CK edge; data and data mask referenced to both edges of DQS
• Burst Lengths: 2, 4, or 8
• CAS Latency: 3
• Auto Precharge option for each burst access
• Auto Refresh and Self Refresh Modes
• 7.8s Maximum Average Periodic Refresh Interval
• 2.5 V (SSTL_2 compatible) I/O
• VDDQ = 2.6 V ± 0.1 V
• VDD = 2.6 V ± 0.1 V
• P-TSOPII-66-1 package
• Lead- and halogene-free = green product



Pinout

  Connection Diagram


Specifications

Parameter
Symbol
Values
Unit
Note/
Test Condition
Min.
Typ.
Max.
Voltage on I/O pins relative to VSS
VIN, VOUT
0.5
-
VDDQ + 0.5
V
-
Voltage on Inputs relative to VSS
VIN
0.5
-
+3.6
V
-
Voltage on VDD supply relative to VSS
VDD
0.5
-
+3.6
V
-
Voltage on VDDQ supply relative to VSS
VDDQ
0.5
-
+3.6
V
-
Operating Temperature (Ambient)
TA
0
-
+70
°C
-
Storage Temperature (Plastic)
TSTG
55
-
+150
°C
-
Power Dissipation
PD
-
1.5
-
W
-
Short Circuit Output Current
IOUT
-
50
-
mA
-
Attention: Stresses above those listed here may cause permanent damage to the device. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Maximum ratings are absolute ratings; exceeding only one of these values may cause irreversible damage to the integrated circuit.


Description

The 16M x 16 Double Data Rate Graphics DRAM HYB25D256161CE-5 is a high-speed CMOS, dynamic random-access memory containing 268,435,456 bits. It is internally configured as a quad-bank DRAM. The 16M x 16 Double Data Rate Graphics DRAM uses a double-data-rate architecture to achieve high-speed operation. The double data rate architecture is essentially a 2n prefetch architecture with an interface designed to transfer two data words per clock cycle at the I/O pins. A single read or write access for the 16M x 16 Double Data Rate Graphics DRAM effectively consists of a single 2n-bit wide, one clock cycle data transfer at the internal DRAM core and two corresponding n-bit wide, one-half-clock-cycle data transfers at the I/O pins.

A bidirectional data strobe (DQS) is transmitted externally, along with data, for use in data capture at the receiver. DQS is a strobe transmitted by the DDR SGRAM HYB25D256161CE-5 during Reads and by the memory controller during Writes. DQS is edge-aligned with data for Reads and center-aligned with data for Writes.

The 16M x 16 Double Data Rate Graphics DRAM HYB25D256161CE-5 operates from a differential clock (CK and CK; the crossing of CK going HIGH and CK going LOW is referred to as the positive edge of CK). Commands (address and control signals) are registered at every positive edge of CK. Input data is registered on both edges of DQS, and output data is referenced to both edges of DQS, as well as toRead and write accesses to the DDR SGRAM are burst oriented; accesses start at a selected location and continue for a programmed number of locations in a programmed sequence. Accesses begin with the registration of an Active command, which is then followed by a Read or Write command. The address bits registered coincident with the Active command are used to select the bank and row to be accessed. The address bits registered coincident with the Read or Write command are used to select the bank and the starting column location for the burst access.

The DDR SGRAM HYB25D256161CE-5 provides for programmable Read or Write burst lengths of 2, 4 or 8 locations. An Auto Precharge function may be enabled to provide a self-timed row precharge that is initiated at the end of the burst access.

As with standard SDRAMs HYB25D256161CE-5, the pipelined, multibank architecture of DDR SGRAMs allows for concurrent operation, thereby providing high effective bandwidth by hiding row precharge and activation time. An auto refresh mode is provided along with a power-saving power-down mode. All inputs are compatible with the
JEDEC Standard for SSTL_2. All outputs are SSTL_2, Class II compatible. both edges of CK.




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