HYE25L256160AC

Features: • 16 Mbits * 16 organisation• Fully synchronous to positive clock edge• Four internal banks for concurrent operation• Data mask (DM) for byte control with write and read data• Programmable CAS latency: 2 or 3• Programmable burst length: 1, 2, 4, 8, or ...

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SeekIC No. : 004369079 Detail

HYE25L256160AC: Features: • 16 Mbits * 16 organisation• Fully synchronous to positive clock edge• Four internal banks for concurrent operation• Data mask (DM) for byte control with write and...

floor Price/Ceiling Price

Part Number:
HYE25L256160AC
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2025/12/27

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Product Details

Description



Features:

• 16 Mbits * 16 organisation
• Fully synchronous to positive clock edge
• Four internal banks for concurrent operation
• Data mask (DM) for byte control with write and read data
• Programmable CAS latency: 2 or 3
• Programmable burst length: 1, 2, 4, 8, or full page
• Programmable wrap sequence: sequential or interleaved
• Random column address every clock cycle (1-N rule)
• Deep power down mode
• Extended mode register for Mobile-RAM features
• Temperature compensated self refresh with on-die temperature sensor
• Partial array self refresh
• Power down and clock suspend mode
• Automatic and controlled precharge command
• Auto refresh mode (CBR)
• 8192 refresh cycles / 64 ms
• Self-refresh with programmble refresh period
• Programmable power reduction feature by partial array activation during self-refresh
• VDDQ = 1.8V or 2.5 V or 3.3 V
• VDD = 2.5 V or 3.3 V
• P-TFBGA-54 package 9-by-6-ball array with 3 depopulated rows (12 x 8 mm2)
• Operating temperature range: extended (25 °C to +85 °C)



Specifications

Parameter
Symbol
Limit Values
Unit
Notes
Test Condition
Min.
typ.
Max.
Voltage on I/O pins relative to VSS
TC
-1.0
-
VDD+ 0.5
V
-
Voltage on I/O pins relative to VSS
TSTG
-1.0
-
+4.6
V
-
Voltage of VDD supply relative to VSS
VDD
-1.0
-
+4.6
V
-
Voltage of VDDQ supply relative to VSS
VDDQ
-1.0
-
+4.6
V
-
Operating Case Temperature (extended)
VIN
-25
-
+85
°C
-
Storage Temperature (Plastic)
TSTG
-55
-
+150
°C
Power dissipation
PD
-
-
0.7
W
-
Short circuit output current
IOUT
-
50
-
mA
-
Attention: Stresses above those listed here may cause permanent damage to the device. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Maximum ratings are absolute ratings; exceeding only one of these values may cause irreversible damage to the integrated circuit.


Description

The HYE25L256160AC Mobile-RAM is a new generation of low power, four bank synchronous DRAM organized as 4 banks x 4 Mbit x 16 with additional features for mobile applications. The synchronous Mobile-RAM achieves high speed data transfer rates by employing a chip architecture that prefetches multiple bits and then synchronizes the output data to a system clock.

The HYE25L256160AC adds new features to the industry standards set for synchronous DRAM products. Parts of the memory array can be selected for Self-Refresh and the refresh period during Self-Refresh is programmable in 4 steps which drastically reduces the self refresh current, depending on the case temperature of the components in the system application. In addition a "Deep Power Down Mode" is available. Operating the four memory banks in an interleave fashion allows random access operation to occur at higher rate. A sequential and gapless data rate is possible depending on burst length, CAS latency and speed grade of the device.

The Mobile-RAM of the HYE25L256160AC is housed in a FBGA "chip-size" package. The Mobile-RAM is available in the extended (25 °C to +85 °C) temperature range.




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