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Part Number: IDT74ALVC162836
Description: This 20-bit universal bus driver is built using advanced dual metal CMOS technology. Data flow from A ...


Description: This 20-bit universal bus driver is built using advanced dual metal CMOS technology. Data flow from A ...
This 20-bit universal bus driver is built using advanced dual metal CMOS technology. Data flow from A to Y is controlled by the output-enable (OE) input. The device operates in the transparent mode when the latch-enable (LE) input is low. When LE is high, the A data is latched if the clock (CLK) input is held at a high or low logic level. If LE is high, the A data is stored in the latch/flip-flop on the low-to-high transition of CLK. When OE is high, the outputs are in the high-impedance state.
The ALVC162836 has series resistors in the device output structure which will significantly reduce line noise when used with light loads. This driver has been designed to drive ±12mA at the designated threshold levels.
|
Symbol |
Rating |
Max
|
Unit |
|
VTERM (VDD) |
VDD Terminal Voltage with Respect to GND |
0.5 to +4.6 |
V |
|
VTERM(2) |
VDDQ Terminal Voltage with Respect to GND |
0.5 to VCC+0.5 |
V |
|
VTERM(2) (INPUTS and I/O's) |
Input and I/O Terminal Voltage with Respect to GND |
65 to +150
|
°C |
|
IOUT |
DC Output Current |
50 to +50
|
°C |
|
TSTG |
Continuous Clamp Current, VI < 0 or VI > VCC |
-65 to +150
|
mA |
|
TJN |
Junction Temperature |
+ 150
|
mA |
|
IOK |
Continuous Clamp Current, VO < 0 |
-50
|
mA |
|
ICC ISS |
Continuous Current through VCC or GND |
±100
|
mA |
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
2. VCC terminals.
3. All terminals except VCC.
IDT74ALVC162836
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