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Part Number: IDT74ALVCH16271

 

 

 

 

Description: The ALVCH16271 is intended for applications in which two separate data paths must be multiplexed onto,...


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IDT74ALVCH16271 General Description


The ALVCH16271 is intended for applications in which two separate data paths must be multiplexed onto, or demultiplexed from, a single data path. This device is particularly suitable as an interface between conventional DRAMs high-speed microprocessors.

A data is stored in the internal A-to-B registers on the low-to-high transition of the clock (CLK) input, provided that the clock-enable (CLKENA) inputs low. Proper control of these inputs allows two sequential 12-bit words to presented as a 24-bit word on the B port. Transparent latches in the B-to-A path allow asynchronous operation to maximize memory access throughput. These latches transfer data when the latch-enable (LE) inputs are low.

The select (SEL) line selects 1B or 2B data for the A inputs. Data flow is controlled by the activelow output enables (OEA, OEB). The ALVCH16271 has been designed with a ±24mA output driver. This driver is capable of driving a moderate to heavy load while maintaining speed performance. The ALVCH16271 has "bus-hold" which retains the inputs' last state whenever

IDT74ALVCH16271 Maximum Ratings

Symbol
Rating
Max
Unit
VTERM
(VDD)
VDD Terminal Voltage
with Respect to GND
0.5 to +4.6
V
VTERM(2)
VDDQ Terminal Voltage
with Respect to GND
0.5 to VCC+0.5
V
VTERM(2)
(INPUTS and I/O's)
Input and I/O Terminal
Voltage with Respect to GND
65 to +150
°C
IOUT
DC Output Current
50 to +50
°C
TSTG
Continuous Clamp Current,
VI < 0 or VI > VCC
-65 to +150
mA
TJN
Junction Temperature
+ 150
mA
IOK
Continuous Clamp Current, VO < 0
-50
mA
ICC
ISS
Continuous Current through
VCC or GND
±100
mA


NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
2. VCC terminals.
3. All terminals except VCC.

IDT74ALVCH16271 Features

• 0.5 MICRON CMOS Technology
• Typical tSK(o) (Output Skew) < 250ps
• ESD > 2000V per MIL-STD-883, Method 3015; > 200V using machine model (C = 200pF, R = 0)
• VCC = 3.3V ± 0.3V, Normal Range
• VCC = 2.7V to 3.6V, Extended Range
• VCC = 2.5V ± 0.2V
• CMOS power levels (0.4µ W typ. static)
• Rail-to-Rail output swing for increased noise margin
• Available in SSOP, TSSOP, and TVSOP packages

IDT74ALVCH16271 Typical Application

• 3.3V high speed systems
• 3.3V and lower voltage computing systems

IDT74ALVCH16271 Connection Diagram

IDT74ALVCH16271  Connection Diagram

IDT74ALVCH16271 datasheet

IDT74ALVCH16271
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