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Part Number: IDT74LVC74A
Description: This dual positive-edge-triggered D-type flip-flop is built using advanced dual metal CMOS technology....


Description: This dual positive-edge-triggered D-type flip-flop is built using advanced dual metal CMOS technology....
This dual positive-edge-triggered D-type flip-flop is built using advanced dual metal CMOS technology. A low level at the preset (PRE) or clear (CLR) inputs sets or resets the outputs, regardless of the levels of the other inputs. When PRE and CLR are inactive, data at the data (D) input meeting the setup time requirements is transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at the D input can be changed without affecting the levels at the outputs.
The LVC74A has been designed with a ±24mA output driver. This driver is capable of driving a moderate to heavy load while maintaining speed performance.
Inputs can be driven from either 3.3V or 5V devices. This feature allows the use of this device as a translator in a mixed 3.3V/5V system environment.
|
Symbol |
Description |
Max |
Unit |
|
VTERM |
Terminal Voltage with Respect to GND |
0.5 to +6.5 |
V |
|
TSTG |
Storage Temperature |
65 to +150 |
°C |
|
IOUT |
DC Output Current |
50 to +50 |
mA |
|
IIK IOK |
Continuous Clamp Current, VI < 0 or VO < 0 |
50 |
mA |
|
ICC ISS |
Continuous Current through each VCC or GND |
±100 |
mA |
NOTE:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
IDT74LVC74A
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