K9W8G08U1M General Description
K9W8G08U1M Maximum Ratings
K9W8G08U1M Features
· Voltage Supply
-1.8V device(K9K4GXXQ0M): 1.70V~1.95V
-3.3V device(K9XXGXXUXM): 2.7 V ~3.6 V
· Organization
- Memory Cell Array
-X8 device(K9XXG08XXM) : (512M + 16,384K)bit x 8bit
-X16 device(K9XXG16XXM) : (256M + 8,192K)bit x 16bit
- Data Register
-X8 device(K9XXG08XXM): (2K + 64)bit x8bit
-X16 device(K9XXG16XXM): (1K + 32)bit x16bit
- Cache Register
-X8 device(K9XXG08XXM) : (2K + 64)bit x8bit
-X16 device(K9XXG16XXM) : (1K + 32)bit x16bit
· Automatic Program and Erase
- Page Program
-X8 device(K9XXG08XXM) : (2K + 64)Byte
-X16 device(K9XXG16XXM) : (1K + 32)Word
- Block Erase
-X8 device(K9XXG08XXM) : (128K + 4K)Byte
-X16 device(K9XXG16XXM) : (64K + 2K)Word
· Page Read Operation
- Page Size
- X8 device(K9XXG08XXM) : 2K-Byte
- X16 device(K9XXG16XXM) : 1K-Word
- Random Read : 25ms(Max.)
- Serial Access : 50ns(Min.)
30ns(Min., K9XXG08UXM only)
512M x 8 Bit / 256M x 16 Bit NAND Flash Memory
· Fast Write Cycle Time
- Program time : 300ms(Typ.)
- Block Erase Time : 2ms(Typ.)
· Command/Address/Data Multiplexed I/O Port
· Hardware Data Protection
- Program/Erase Lockout During Power Transitions
· Reliable CMOS Floating-Gate Technology
- Endurance : 100K Program/Erase Cycles
- Data Retention : 10 Years
· Command Register Operation
· Cache Program Operation for High Performance Program
· Power-On Auto-Read Operation
· Intelligent Copy-Back Operation
· Unique ID for Copyright Protection
· Package :
- K9XXGXXXXM-YCB0/YIB0
48 - Pin TSOP I (12 x 20 / 0.5 mm pitch)
- K9W8G08U1M-YCB0/YIB0 : Two K9K4G08U0M stacked.
48 - Pin TSOP I (12 x 20 / 0.5 mm pitch)
- K9XXGXXXXM-PCB0/PIB0
48 - Pin TSOP I (12 x 20 / 0.5 mm pitch)
- K9W8G08U1M-PCB0/PIB0 : Two K9K4G08U0M stacked.
48 - Pin TSOP I (12 x 20 / 0.5 mm pitch)
K9W8G08U1M Connection Diagram
Map list: ABCDEFGHIJKLMNOPQRSTUVWXYZ 0123456789All