LF398

SpecificationsTemperature Min0 deg CTemperature Max70 deg COffset Voltage max, 25C3, 10 mV View Using CatalogDescriptionThe LF198/LF298/LF398 are monolithic sample-and-hold circuits which utilize BI-FET technology to obtain ultra-high dc accuracy with fast acquisition of signal and low droop rate....

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SeekIC No. : 004393772 Detail

LF398: SpecificationsTemperature Min0 deg CTemperature Max70 deg COffset Voltage max, 25C3, 10 mV View Using CatalogDescriptionThe LF198/LF298/LF398 are monolithic sample-and-hold circuits which utilize BI...

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Part Number:
LF398
Supply Ability:
5000

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  • 1~5000
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  • 15 Days
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Upload time: 2024/4/18

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Product Details

Description



Specifications

Temperature Min0 deg C
Temperature Max70 deg C
Offset Voltage max, 25C3, 10 mV
View Using Catalog



Description

The LF198/LF298/LF398 are monolithic sample-and-hold circuits which utilize BI-FET technology to obtain ultra-high dc accuracy with fast acquisition of signal and low droop rate. Operating as a unity gain follower, dc gain accuracy is 0.002% typical and acquisition time is as low as 6 µs to 0.01%. A bipolar input stage is used to achieve low offset voltage and wide bandwidth. Input offset adjust is accomplished with a single pin, and does not degrade input offset drift. The wide bandwidth allows the LF198 to be included inside the feedback loop of 1 MHz op amps without having stability problems. Input impedance of 1010Ohm allows high source impedances to be used without degrading accuracy.

P-channel junction FET's are combined with bipolar devices in the output amplifier to give droop rates as low as 5 mV/min with a 1 µF hold capacitor. The JFET's have much lower noise than MOS devices used in previous designs and do not exhibit high temperature instabilities. The overall design guarantees no feed-through from input to output in the hold mode, even for input signals equal to the supply voltages.

Reliability Metrics


Part Number Process EFR Reject EFR Sample Size PPM LTA Rejects LTA Device Hours FITS MTTF (Hours)
LF398 MDC BIFET 0 12335 0 0 975000 4 276658912
LF398 MWC BIFET 0 12335 0 0 975000 4 276658912
LF398AH BIFET 0 12335 0 0 975000 4 276658912
LF398AN BIFET 0 12335 0 0 975000 4 276658912
LF398H BIFET 0 12335 0 0 975000 4 276658912
LF398M BIFET 0 12335 0 0 975000 4 276658912
LF398MX BIFET 0 12335 0 0 975000 4 276658912
LF398N BIFET 0 12335 0 0 975000 4 276658912

Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR. The Long Term Failure Rates were calculated at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress temperature of 150°C to an application temperature of 55°C.

For more information on Reliability Metrics, please click here.


Application Notes


Title Size in Kbytes Date
AN-298: Application Note 298 Isolation Techniques for Signal Conditioning 379 Kbytes 2-Oct-02 Download
AN-775: Specifications and Architectures of Sample-and-Hold Amplifiers 111 Kbytes 5-Aug-95 Download
AN-775 (Japanese): Specifications and Architectures of Sample-and-Hold Amplifiers
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251 Kbytes  
AN-266: Application Note 266 Circuit Applications of Sample-Hold Amplifiers 508 Kbytes 2-Oct-02 Download
AN-258: Application Note 258 Data Acquisition Using the ADC0816 and ADC0817 8-Bit A/D Converter with On-Chip 16 Channel Multiplexer 683 Kbytes 4-Oct-04 Download
AN-301: Application Note 301 Signal Conditioning for Sophisticated Transducers 579 Kbytes 2-Oct-02 Download
AN-247: Application Note 247 Using the ADC0808/ADC0809 8-Bit µP Compatible A/D Converters with 8-Channel Analog Multiplexer 547 Kbytes 3-Oct-02 Download

If you have trouble printing or viewing PDF file(s), see Printing Problems.

More Application Notes


Title Size in Kbytes Date
AN-292: Application Note 292 Applications of the LM3524 Pulse-Width-Modulator 239 Kbytes 3-Oct-02 Download

If you have trouble printing or viewing PDF file(s), see Printing Problems.




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