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Part Number: M58LW032D
Description: Stressing the device above the ratings listed in Table 11, Absolute Maximum Ratings, may cause permane...


Description: Stressing the device above the ratings listed in Table 11, Absolute Maximum Ratings, may cause permane...
Stressing the device above the ratings listed in Table 11, Absolute Maximum Ratings, may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant quality documents.
|
Symbol |
Parameter |
Value
|
Unit | |
|
Min |
Max | |||
|
TBIAS |
Temperature Under Bias |
40 |
125 |
°C |
|
TSTG |
Storage Temperature |
55 |
150 |
°C |
|
VIO |
Input or Output Voltage |
0.6 |
VDDQ +0.6 |
V |
|
VDD, VDDQ |
Supply Voltage |
0.6 |
5.0 |
V |
|
IOSC |
Output Short-circuit Current |
100(1) |
mA | |
M58LW032D
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