MRF5P21180

Features: • Typical 2carrier WCDMA Performance for VDD = 28 Volts,IDQ = 2 x 800 mA, f1 = 2135 MHz, f2 = 2145 MHz,Channel Bandwidth = 3.84 MHz, Adjacent Channels Measured over3.84 MHz BW @ f1 5 MHz and f2 + 5 MHz. Distortion ProductsMeasured over a 3.84 MHz BW @ f1 10 MHz and f2 + 10 MHz,Ea...

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SeekIC No. : 004427007 Detail

MRF5P21180: Features: • Typical 2carrier WCDMA Performance for VDD = 28 Volts,IDQ = 2 x 800 mA, f1 = 2135 MHz, f2 = 2145 MHz,Channel Bandwidth = 3.84 MHz, Adjacent Channels Measured over3.84 MHz BW @ f1 ...

floor Price/Ceiling Price

Part Number:
MRF5P21180
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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268 Transactions

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Upload time: 2026/1/27

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Product Details

Description



Features:

• Typical 2carrier WCDMA Performance for VDD = 28 Volts,IDQ = 2 x 800 mA, f1 = 2135 MHz, f2 = 2145 MHz,Channel Bandwidth = 3.84 MHz, Adjacent Channels Measured over3.84 MHz BW @ f1 5 MHz and f2 + 5 MHz. Distortion ProductsMeasured over a 3.84 MHz BW @ f1 10 MHz and f2 + 10 MHz,Each Carrier Peak/Avg. = 8.5 dB @ 0.01% Probability on CCDF.Output Power - 38 Watts Avg.Power Gain - 14 dBEfficiency - 25.5%IM3 - 37.5 dBc
ACPR - 41 dBc
• Internally Matched, Controlled Q, for Ease of Use
• High Gain, High Efficiency and High Linearity
• Integrated ESD Protection
• Designed for Maximum Gain and Insertion Phase Flatness
• Capable of Handling 10:1 VSWR, @ 28 Vdc, 2140 MHz, 180 Watts CWOutput Power
• Excellent Thermal Stability
• Characterized with Series Equivalent LargeSignal Impedance Parameters
• Qualified Up to a Maximum of 32 VDD Operation




Specifications

Rating Symbol Value Unit
DrainSource Voltage VDSS 65 Vdc
GateSource Voltage VGS 0.5, +15 Vdc
Total Device Dissipation @ TC = 25
Derate above 25
PD 437.5
2.5
Watts
W/
Storage Temperature Range Tstg 65 to +150
Operating Junction Temperature TJ 200
NOTE CAUTION MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and packaging MOS devices should be observed.


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