MX7528

Features: SpecificationsDescriptionThe MX7528/MX7628 contains two 8-bit multiplying digital-to-analog converters (DACs).Separate on-chip latches hold the input data for each DAC to allow easy interface to microprocessors.The data load operation is similar to a static RAM write cycle.Data is loaded...

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SeekIC No. : 004431824 Detail

MX7528: Features: SpecificationsDescriptionThe MX7528/MX7628 contains two 8-bit multiplying digital-to-analog converters (DACs).Separate on-chip latches hold the input data for each DAC to allow easy interf...

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Part Number:
MX7528
Supply Ability:
5000

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  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/4/27

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Product Details

Description



Features:






Specifications






Description

The MX7528/MX7628 contains two 8-bit multiplying digital-to-analog converters (DACs).Separate on-chip latches hold the input data for each DAC to allow easy interface to microprocessors.The data load operation is similar to a static RAM write cycle.Data is loaded using only CS,WR,and DAC select (DAC A/DAC B)input.

The MX7528/MX7628 have some absolute maximum ratings.When parameter is VDD to AGND,the rating is 0V,+17V.When parameter is VDD to DGND,the rating is 0V,+7V.When parameter is AGND to DGND,the rating is VDD.When parameter is DGND to AGND,the rating is VDD.When parameter is digital input voltage to DGND,the rating is -0.3V,VDD.When parameter is Pin2,Pin20 to AGND,the rating is -0.3V,VDD.When parameter is VREFA,VREFB,to AGND,the rating is ±25V.When parameter is VRFBA,VRFBB,to AGND,the rating is ±25V.When parameter is power dissipation (any package) to +75,the rating is 450mW.When parameter is power dissipation (any package) derate above +75 by,the rating is 6W/.When parameter is storage temperature range,the rating is -65 to +160.When parameter is lead temperature (soldering,10sec),the rating is +300.

Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the MX7528.These are stress ratings only,and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of specifications is not implied.Exposure to absolute maximum rating conditions for extended periods may affect device reliability.






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