NUP1105L

Features: • SOT−23 Package Allows One Separate Bidirectional Configuration• 350 W Peak Power Dissipation per Line (8 x 20 sec Waveform)• Low Reverse Leakage Current (< 100 nA)• IEC Compatibility: − IEC 61000−4−2 (ESD): Level 4 − IEC...

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SeekIC No. : 004436737 Detail

NUP1105L: Features: • SOT−23 Package Allows One Separate Bidirectional Configuration• 350 W Peak Power Dissipation per Line (8 x 20 sec Waveform)• Low Reverse Leakage Current (< 100...

floor Price/Ceiling Price

Part Number:
NUP1105L
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Month Sales

268 Transactions

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evaluate  (4.8 stars)

Upload time: 2024/4/26

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Product Details

Description



Features:

• SOT−23 Package Allows One Separate Bidirectional Configuration
• 350 W Peak Power Dissipation per Line (8 x 20 sec Waveform)
• Low Reverse Leakage Current (< 100 nA)
• IEC Compatibility: − IEC 61000−4−2 (ESD): Level 4
− IEC 61000−4−4 (EFT): 40 A 5/50 ns
− IEC 61000−4−5 (Lighting) 8.0 A (8/20 s)
• ISO 7637−1, Nonrepetitive EMI Surge Pulse TBD
• ISO 7637−3, Repetitive Electrical Fast Transient (EFT) TBD EMI Surge Pulses
• Flammability Rating UL 94 V−0
• Pb−Free Packages are Available



Application

• Automotive Electronics
-  LIN Bus
-  Single Line CAN
• Industrial Control Networks
-  Smart Distribution Systems (SDS™)
-  DeviceNet™



Pinout

  Connection Diagram


Specifications

Symbol
Rating
Value
Unit
PPK
Peak Power Dissipation
8 x 20 s Double Exponential Waveform (Note 1)

350
W
TJ
Operating Junction Temperature Range
−40 to 125
°C
TJ
Storage Temperature Range
−55 to 150
°C
TL
Lead Solder Temperature (10 s)
260
°C
ESD
Human Body model (HBM)
Machine Model (MM)
IEC 61000−4−2 Specification (Contact)
16
400
30
kV
V
kV

Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and  re not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected.
1. Nonrepetitive current pulse per Figure 1.



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