RTAX250SL

Features: • Single-Chip, Nonvolatile Solution• 1.5 V Core Voltage for Low Power• Flexible, Multi-Standard I/Os: 1.5 V, 1.8 V, 2.5 V, 3.3 V Mixed Voltage Operation Bank-Selectable I/Os 8 Banks per Chip Single-Ended I/O Standards: LVTTL, LVCMOS, 3.3 V PCI JTAG Boundary Scan Testin...

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SeekIC No. : 004480053 Detail

RTAX250SL: Features: • Single-Chip, Nonvolatile Solution• 1.5 V Core Voltage for Low Power• Flexible, Multi-Standard I/Os: 1.5 V, 1.8 V, 2.5 V, 3.3 V Mixed Voltage Operation Bank-Selectable I...

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Part Number:
RTAX250SL
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/4/28

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Product Details

Description



Features:

• Single-Chip, Nonvolatile Solution
• 1.5 V Core Voltage for Low Power
• Flexible, Multi-Standard I/Os:
1.5 V, 1.8 V, 2.5 V, 3.3 V Mixed Voltage Operation
Bank-Selectable I/Os 8 Banks per Chip
Single-Ended I/O Standards: LVTTL, LVCMOS, 3.3 V PCI
JTAG Boundary Scan Testing (as per IEEE 1149.1)
Differential I/O Standards: LVPECL and LVDS
Voltage-Referenced I/O Standards: GTL+, HSTL Class 1, SSTL2 Class 1 and 2, SSTL3 Class 1 and 2
Hot-Swap Compliant with Cold-Sparing Support (Except PCI)
• Embedded Memory with Variable Aspect Ratio and Organizations:
Independent, Width-Configurable Read and Write Ports
Programmable Embedded FIFO Control Logic
ROM Emulation Capability
• Deterministic, User-Controllable Timing
• Unique In-System Diagnostic and Debug Capability





Specifications

Symbol Parameter Limits Units
VCCA AC Core Supply Voltage1 0.3 to 1.8 V
VCCA DC Core Supply Voltage 0.3 to 1.7 V
VCCI DC I/O Supply Voltage 0.3 to 3.75 V
VREF DC I/O Reference Voltage 0.3 to 3.75 V
VI Input Voltage 0.5 to 3.75 V
VO Output Voltage 0.5 to 3.75 V
TSTG Storage Temperature 60 to +150
VCCDA2 Supply Voltage for Differential I/Os 0.3 to 3.75 V

Notes:
1. The AC transient VCCA limit is for radiation-induced transients less than 10 s duration and not intended for repetitive use. Core voltage spikes from a single event transient will not negatively affect the reliability of the device if, for this non-repetitive event, the transient does not exceed 1.8 V at any time and the total time that the transient exceeds 1.575 V does not exceed 10 s in duration.
2. VCCDA must be greater than or equal to the highest VCCI voltage






Description






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