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SCAN16512

Features: IEEE 1149.1 (JTAG) Compliant 2.7V to 3.6V VCC Operation TRI-STATE outputs for bus-oriented applications Dual byte-wide data for bus applications Power down high Impedance inputs and outputs Optional Bus Hold on data inputs eliminates the need for external pullup/pulldown resistors (SCAN...

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SeekIC No. : 004485822 Detail

SCAN16512: Features: IEEE 1149.1 (JTAG) Compliant 2.7V to 3.6V VCC Operation TRI-STATE outputs for bus-oriented applications Dual byte-wide data for bus applications Power down high Impedance inputs and outpu...

SCAN16512 Data Sheet

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Part Number:
SCAN16512
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Product Details

Description



Features:

IEEE 1149.1 (JTAG) Compliant
2.7V to 3.6V VCC Operation
TRI-STATE outputs for bus-oriented applications
Dual byte-wide data for bus applications
Power down high Impedance inputs and outputs
Optional Bus Hold on data inputs eliminates the need for external pullup/pulldown resistors (SCANH16512, SCANH162512 versions)
Optional 25 series resistors in outputs to minimize noise and eliminate termination resistors (SCAN162512, SCANH162512 versions)
Supports live insertion/withdrawal
Includes CLAMP and HIGHZ instructions


Specifications

Supply Voltage (VCC)                                                                −0.5V to +4.6V
DC Input Diode Current (IIK)
VI = −0.5V                                                                                −50 mA
DC Output Diode Current (IOK)
VO = −0.5V                                                                               −50 mA
DC Input Voltage (VI)                                                               −0.5V to 4.6V
DC Output Voltage (VO)                                                           −0.5V to 4.6V
DC Output Source/Sink Current (IO)                                        ±50 mA
DC VCC or Ground Current
Per Supply Pin                                                                         ±100 mA
Junction Temperature                                                              +150°C
Storage Temperature                                                              −65°C to +150°C
Lead Temperature (Solder, 4sec)
64L BGA                                                                                   220 °C
Thermal Resistance
BGA JA                                                                                   62°C/W
Package Derating                                                                   16.1mW/°C above 25°C
ESD (Min)                                                                                1000V


Description

The SCAN16512 is a high speed, low-power universal bus transceiver featuring data inputs organized into two 8-bit bytes with output enable and latch enable control signals. This function is configurable as a D-type Latch or Flip-Flop, and can operate in transparent, latched, or clocked mode. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), Test Clock (TCK), and Test Reset (TRST).




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