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SCAN182373A

Features: IEEE 1149.1 (JTAG) Compliant High performance BiCMOS technology 25 series resistor outputs eliminate need for external terminating resistors Buffered active-low latch enable 3-STATE outputs for bus-oriented applications 25 mil pitch SSOP (Shrink Small Outline Package) Includes CLAMP, ID...

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SeekIC No. : 004485824 Detail

SCAN182373A: Features: IEEE 1149.1 (JTAG) Compliant High performance BiCMOS technology 25 series resistor outputs eliminate need for external terminating resistors Buffered active-low latch enable 3-STATE outpu...

SCAN182373A Data Sheet

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Part Number:
SCAN182373A
Supply Ability:
5000

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  • 1~5000
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  • 15 Days
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Upload time: 2025/12/26

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Product Details

Description



Features:

  IEEE 1149.1 (JTAG) Compliant
  High performance BiCMOS technology
  25 series resistor outputs eliminate need for external terminating resistors
  Buffered active-low latch enable
  3-STATE outputs for bus-oriented applications
  25 mil pitch SSOP (Shrink Small Outline Package)
  Includes CLAMP, IDCODE and HIGHZ instructions
  Additional instructions SAMPLE-IN, SAMPLE-OUT and EXTEST-OUT
  Power up 3-STATE for hot insert
  Member of Fairchild's SCAN Products


Pinout

Connection Diagram


Specifications

Storage Temperature                                                            −65  to +150 
Ambient Temperature under Bias                                          −55  to +125 
Junction Temperature under Bias                                          −55  to +150 
VCC Pin Potential to Ground Pin                                            −0.5V to +7.0V
Input Voltage (Note 2)                                                          −0.5V to +7.0V
Input Current (Note 2)                                                          −30 mA to +5.0 mA
Voltage Applied to Any Output
in Disabled or Power-Off State                                              −0.5V to +5.5V
in the HIGH State                                                                  −0.5V to VCC
Current Applied to Output
in LOW State (Max)                                                                Twice the Rated IOL (mA)
DC Latchup Source Current                                                    −500 mA
Over Voltage Latchup (I/O)                                                    10V
ESD (HBM) Min                                                                        2000V


Description

The SCAN182373A is a high performance BiCMOS transparent latch featuring separate data inputs organized into dual 9-bit bytes with byte-oriented latch enable and output enable control signals. This SCAN182373A is compliant with IEEE 1149.1 Standard Test Access Port and Boundary-Scan Architecture with the incorporation of the defined boundaryscan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS),
and Test Clock (TCK).




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