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SCAN18245T

Features: IEEE 1149.1 (JTAG) CompliantDual output enable control signals TRI-STATE outputs for bus-oriented applications 9-bit data busses for parity applications Reduced-swing outputs source 24 mA/sink 48 mA Guaranteed to drive 50W transmission line to TTL input levels of 0.8V and 2.0V TTL compa...

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SeekIC No. : 004485826 Detail

SCAN18245T: Features: IEEE 1149.1 (JTAG) CompliantDual output enable control signals TRI-STATE outputs for bus-oriented applications 9-bit data busses for parity applications Reduced-swing outputs source 24 mA...

SCAN18245T Data Sheet

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Part Number:
SCAN18245T
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2025/12/26

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Product Details

Description



Features:

IEEE 1149.1 (JTAG) Compliant
 Dual output enable control signals
TRI-STATE outputs for bus-oriented applications
9-bit data busses for parity applications
Reduced-swing outputs source 24 mA/sink 48 mA
Guaranteed to drive 50W transmission line to TTL input levels of 0.8V and 2.0V
TTL compatible inputs
25 mil pitch Cerpack package
Includes CLAMP and HIGHZ instructions
Available as Known Good Die
Standard Microcircuit Drawing (SMD) 5962-9311501


Pinout

Connection Diagram


Specifications

If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/Distributors for availability and specifications.
Supply Voltage (VCC)                                                        −0.5V to +7.0V
DC Input Diode Current (IIK)
VI = −0.5V                                                                        −20 mA
VI = VCC +0.5V                                                                 +20 mA
DC Output Diode Current (IOK)
VO = −0.5V                                                                       −20 mA
VO = VCC +0.5V                                                                +20 mA
DC Output Voltage (VO)                                                    −0.5V to VCC +0.5V
DC Output Source/Sink Current (IO)                                ±70 mA
DC VCC or Ground Current
Per Output Pin                                                                ±70 mA
Junction Temperature
Cerpack                                                                          +175
Storage Temperature                                                     −65 to +150
ESD (Min)                                                                        2000V


Description

The SCAN18245T is a high speed, low-power bidirectional line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented output enable and direction control signals. This SCAN18245T is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).




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