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SCAN182541A

Features: IEEE 1149.1 (JTAG) Compliant High performance BiCMOS technology 25 series resistor outputs eliminate need for external terminating resistors Dual output enable signals per byte 3-STATE outputs for bus-oriented applications 25 mil pitch SSOP (Shrink Small Outline Package) Includes CLAMP,...

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SeekIC No. : 004485827 Detail

SCAN182541A: Features: IEEE 1149.1 (JTAG) Compliant High performance BiCMOS technology 25 series resistor outputs eliminate need for external terminating resistors Dual output enable signals per byte 3-STATE ou...

SCAN182541A Data Sheet

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Part Number:
SCAN182541A
Supply Ability:
5000

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  • 1~5000
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  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2025/12/26

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Product Details

Description



Features:

  IEEE 1149.1 (JTAG) Compliant
  High performance BiCMOS technology
  25 series resistor outputs eliminate need for external terminating resistors
  Dual output enable signals per byte
  3-STATE outputs for bus-oriented applications
  25 mil pitch SSOP (Shrink Small Outline Package)
  Includes CLAMP, IDCODE and HIGHZ instructions
  Additional instructions SAMPLE-IN, SAMPLE-OUT and EXTEST-OUT
  Power up 3-STATE for hot insert
  Member of Fairchild's SCAN Products


Pinout

Connection Diagram


Specifications

Storage Temperature                                                                               −65°C to +150°C
Ambient Temperature under Bias                                                             −55°C to +125°C
Junction Temperature under Bias                                                             −55°C to +150°C
VCC Pin Potential to Ground Pin                                                               −0.5V to +7.0V
Input Voltage (Note 2)                                                                             −0.5V to +7.0V
Input Current (Note 2)                                                                             −30 mA to +5.0 mA
Voltage Applied to Any Output
in Disabled or Power-Off State                                                                 −0.5V to +5.5V
in the HIGH State                                                                                     −0.5V to VCC
Current Applied to Output
in LOW State (Max)                                                                                  Twice the Rated IOL (mA)
DC Latchup Source Current                                                                      −500 mA
Over Voltage Latchup (I/O)                                                                      10V
EDS (HBM) Min.                                                                                         2000V


Description

The SCAN182541A is a high performance BiCMOS line driver featuring separate data inputs organized into dual 9- bit bytes with byte-oriented paired output enable control signals. This SCAN182541A is compliant with IEEE 1149.1 Standard Test Access Port and Boundary-Scan architecture with the incorporation of the defined Boundary-Scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).




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